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Publication search results
found 59 matches
- 2009
- Davide Appello, Paolo Bernardi, Simone Gerardin, Michelangelo Grosso, Alessandro Paccagnella, Paolo Rech, Matteo Sonza Reorda:
DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study. VTS 2009: 276-281 - Masayuki Arai, Akifumi Suto, Kazuhiko Iwasaki, Katsuyuki Nakano, Michihiro Shintani, Kazumi Hatayama, Takashi Aikyo:
Small Delay Fault Model for Intra-Gate Resistive Open Defects. VTS 2009: 27-32 - A. Hakan Baba, Subhasish Mitra:
Testing for Transistor Aging. VTS 2009: 215-220 - Sounil Biswas, Ronald D. Blanton:
Maintaining Accuracy of Test Compaction through Adaptive Re-learning. VTS 2009: 257-263 - Kenneth Blakkan, Mani Soma:
A Time Domain Method to Measure Oscillator Phase Noise. VTS 2009: 297-302 - Gaetan Canivet, Régis Leveugle, Jessy Clédière, Frédéric Valette, Marc Renaudin:
Characterization of Effective Laser Spots during Attacks in the Configuration of a Virtex-II FPGA. VTS 2009: 327-332 - Unni Chandran, Dan Zhao:
SS-KTC: A High-Testability Low-Overhead Scan Architecture with Multi-level Security Integration. VTS 2009: 321-326 - Hsiu-Ming Chang, Chin-Hsuan Chen, Kuan-Yu Lin, Kwang-Ting Cheng:
Calibration and Testing Time Reduction Techniques for a Digitally-Calibrated Pipelined ADC. VTS 2009: 291-296 - Te-Hsuan Chen, Yu-Ying Hsiao, Yu-Tsao Hsing, Cheng-Wen Wu:
An Adaptive-Rate Error Correction Scheme for NAND Flash Memory. VTS 2009: 53-58 - Zhen Chen, Dong Xiang, Boxue Yin:
The ATPG Conflict-Driven Scheme for High Transition Fault Coverage and Low Test Cost. VTS 2009: 146-151 - Sunghoon Chun, YongJoon Kim, Taejin Kim, Sungho Kang:
A High-Level Signal Integrity Fault Model and Test Methodology for Long On-Chip Interconnections. VTS 2009: 152-157 - Jaeyong Chung, Jacob A. Abraham:
Recursive Path Selection for Delay Fault Testing. VTS 2009: 65-70 - Kun Young Chung, Sandeep K. Gupta:
Efficient Scheduling of Path Delay Tests for Latch-Based Circuits. VTS 2009: 103-110 - Bernard Courtois, Ali Shakouri:
Microscale and Nanoscale Thermal Characterization of Integrated Circuit Chips. VTS 2009: 241 - Bernard Courtois, Chandu Visweswariah:
Special Session 8: New Topics: At-Speed Testing in the Face of Process Variations. VTS 2009: 237 - Rudrajit Datta, Nur A. Touba:
Exploiting Unused Spare Columns to Improve Memory ECC. VTS 2009: 47-52 - Erdem Serkan Erdogan, Sule Ozev:
A Packet Based 2x-Site Test Solution for GSM Transceivers with Limited Tester Resources. VTS 2009: 303-308 - Hongxia Fang, Krishnendu Chakrabarty, Abhijit Jas, Srinivas Patil, Chandra Tirumurti:
RT-Level Deviation-Based Grading of Functional Test Sequences. VTS 2009: 264-269 - Edward Flanigan, Spyros Tragoudas, Arkan Abdulrahman:
Scalable Compact Test Pattern Generation for Path Delay Faults Based on Functions. VTS 2009: 140-145 - Jianliang Gao, Yinhe Han, Xiaowei Li:
A New Post-Silicon Debug Approach Based on Suspect Window. VTS 2009: 85-90 - Sandeep Kumar Goel, Narendra Devta-Prasanna, Ritesh P. Turakhia:
Effective and Efficient Test Pattern Generation for Small Delay Defect. VTS 2009: 111-116 - Abdul Wahid Hakmi, Stefan Holst, Hans-Joachim Wunderlich, Jürgen Schlöffel, Friedrich Hapke, Andreas Glowatz:
Restrict Encoding for Mixed-Mode BIST. VTS 2009: 179-184 - Nicolas Houarche, Mariane Comte, Michel Renovell, Alejandro Czutro, Piet Engelke, Ilia Polian, Bernd Becker:
An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects. VTS 2009: 21-26 - Yong-Jyun Hu, Yu-Jen Huang, Jin-Fu Li:
Modeling and Testing Comparison Faults of TCAMs with Asymmetric Cells. VTS 2009: 15-20 - Keith A. Jenkins, Lionel Li:
A Scalable, Digital BIST Circuit for Measurement and Compensation of Static Phase Offset. VTS 2009: 185-188 - Bhanu Kapoor:
Special Session 11C: Embedded Tutorial: System-on-a-Chip Power Management Implications on Validation and Testing. VTS 2009: 333 - Ajay Khoche, Jay Katz, Sauro Landini, Kochen Liao, Neetu Agrawal, Glenn Plowman, Songlin Zuo, Liyang Lai, John Rowe, Thomas Zanon:
STDF Memory Fail Datalog Standard. VTS 2009: 209-214 - Kee Sup Kim:
Panel: Apprentice - VTS Edition: Season 2. VTS 2009: 119 - Haluk Konuk:
Defect Detection Differences between Launch-Off-Shift and Launch-Off-Capture in Sense-Amplifier-Based Flip-Flop Testing. VTS 2009: 33-38 - Haluk Konuk:
DFT and Test Problems from the Trenches. VTS 2009: 120
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