"Small Delay Fault Model for Intra-Gate Resistive Open Defects."

Masayuki Arai et al. (2009)

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DOI: 10.1109/VTS.2009.25

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Masayuki Arai, Akifumi Suto, Kazuhiko Iwasaki, Katsuyuki Nakano, Michihiro Shintani, Kazumi Hatayama, Takashi Aikyo:
Small Delay Fault Model for Intra-Gate Resistive Open Defects. VTS 2009: 27-32

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