default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDSoumendu Bhattacharya
Person information
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
Books and Theses
- 2005
[b1]Soumendu Bhattacharya:
Alternate Testing of Analog and RF Systems using Extracted Test Response Features. Georgia Institute of Technology, Atlanta, GA, USA, 2005
Journal Articles
- 2012
- [j11]Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee:
Concurrent Device/Specification Cause-Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures. IEEE Des. Test Comput. 29(1): 48-58 (2012) - [j10]Vishwanath Natarajan, Hyun Woo Choi, Aritra Banerjee, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler, Soumendu Bhattacharya:
Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(7): 1088-1101 (2012) - 2009
- [j9]Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhijit Chatterjee:
Efficient EVM Testing of Wireless OFDM Transceivers Using Null Carriers. IEEE Trans. Very Large Scale Integr. Syst. 17(6): 803-814 (2009) - 2008
- [j8]Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee:
System-Level Specification Testing Of Wireless Transceivers. IEEE Trans. Very Large Scale Integr. Syst. 16(3): 263-276 (2008) - 2007
- [j7]Donghoon Han, Soumendu Bhattacharya, Abhijit Chatterjee:
Low-cost parametric test and diagnosis of RF systems using multi-tone response envelope detection. IET Comput. Digit. Tech. 1(3): 170-179 (2007) - [j6]Ramakrishna Voorakaranam, Selim Sermet Akbay, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee:
Signature Testing of Analog and RF Circuits: Algorithms and Methodology. IEEE Trans. Circuits Syst. I Regul. Pap. 54-I(5): 1018-1031 (2007) - 2006
- [j5]Soumendu Bhattacharya, Abhijit Chatterjee:
A DFT Approach for Testing Embedded Systems Using DC Sensors. IEEE Des. Test Comput. 23(6): 464-475 (2006) - [j4]Soumendu Bhattacharya, Sankar Nair
, Abhijit Chatterjee:
An Accurate DNA Sensing and Diagnosis Methodology Using Fabricated Silicon Nanopores. IEEE Trans. Circuits Syst. I Regul. Pap. 53-I(11): 2377-2383 (2006) - 2005
- [j3]Soumendu Bhattacharya, Achintya Halder, Ganesh Srinivasan, Abhijit Chatterjee:
Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications. J. Electron. Test. 21(3): 323-339 (2005) - [j2]Soumendu Bhattacharya, Abhijit Chatterjee:
Optimized wafer-probe and assembled package test design for analog circuits. ACM Trans. Design Autom. Electr. Syst. 10(2): 303-329 (2005) - 1993
- [j1]Abhijit Chatterjee, Partha Pratim Das, Soumendu Bhattacharya:
Visualization in linear programming using parallel coordinates. Pattern Recognit. 26(11): 1725-1736 (1993)
Conference and Workshop Papers
- 2013
- [c24]Shyam Kumar Devarakond, Jennifer McCoy, Amit Nahar, John M. Carulli Jr., Soumendu Bhattacharya, Abhijit Chatterjee:
Predicting die-level process variations from wafer test data for analog devices: A feasibility study. LATW 2013: 1-6 - 2011
- [c23]Aritra Banerjee, Vishwanath Natarajan, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Soumendu Bhattacharya:
Optimized Multitone Test Stimulus Driven Diagnosis of RF Transceivers Using Model Parameter Estimation. VLSI Design 2011: 274-279 - 2010
- [c22]Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee:
Concurrent process model and specification cause-effect monitoring using alternate diagnostic signatures. VTS 2010: 337-342 - 2009
- [c21]Abhijit Chatterjee, Donghoon Han, Vishwanath Natarajan, Shyam Kumar Devarakond, Shreyas Sen, Hyun Woo Choi, Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhilash Goyal, Deuk Lee, Madhavan Swaminathan:
Iterative built-in testing and tuning of mixed-signal/RF systems. ICCD 2009: 319-326 - 2008
- [c20]Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhijit Chatterjee:
Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise. VTS 2008: 175-180 - 2007
- [c19]Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee:
Probabilistic Compensation for Digital Filters Using Pervasive Noise-Induced Operator Errors. VTS 2007: 125-130 - 2006
- [c18]Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee:
Improving SNR for DSM Linear Systems Using Probabilistic Error Correction and State Restoration: A Comparative Study. ETS 2006: 35-42 - [c17]Donghoon Han, Shalabh Goyal, Soumendu Bhattacharya, Abhijit Chatterjee:
Low Cost Parametric Failure Diagnosis of RF Transceivers. ETS 2006: 205-212 - [c16]Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee:
Probabilistic Error Correction in Linear Digital Filters Using Checksum Codes. LATW 2006: 192-197 - [c15]Soumendu Bhattacharya, Vishwanath Natarajan, Abhijit Chatterjee, Sankar Nair:
Efficient DNA Sensing with Fabricated Silicon Nanopores: Diagnosis Methodology and Algorithms. VLSI Design 2006: 729-733 - [c14]Vishwanath Natarajan, Soumendu Bhattacharya, Abhijit Chatterjee:
Alternate Electrical Tests for Extracting Mechanical Parameters of MEMS Accelerometer Sensors. VTS 2006: 192-199 - [c13]Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee:
Design of Soft Error Resilient Linear Digital Filters Using Checksum-Based Probabilistic Error Correction. VTS 2006: 208-213 - 2005
- [c12]Donghoon Han, Selim Sermet Akbay, Soumendu Bhattacharya, Abhijit Chatterjee, William R. Eisenstadt:
On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST). IOLTS 2005: 106-111 - [c11]Soumendu Bhattacharya, Rajarajan Senguttuvan, Abhijit Chatterjee:
Production test enhancement techniques for MB-OFDM ultra-wide band (UWB) devices: EVM and CCDF. ITC 2005: 10 - [c10]Achintya Halder, Soumendu Bhattacharya, Ganesh Srinivasan, Abhijit Chatterjee:
A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode. VLSI Design 2005: 289-294 - [c9]Soumendu Bhattacharya, Abhijit Chatterjee:
Production Test Methods for Measuring 'Out-of-Band' Interference of Ultra Wide Band (UWB) Devices. VTS 2005: 137-142 - 2004
- [c8]Soumendu Bhattacharya, Abhijit Chatterjee:
A Built-In Loopback Test Methodology for RF Transceiver Circuits Using Embedded Sensor Circuits. Asian Test Symposium 2004: 68-73 - [c7]Ganesh Srinivasan, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee:
Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit. DATE 2004: 280-285 - [c6]Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Abhijit Chatterjee:
Test Time Reduction for ACPR Measurement of Wireless Transceivers Using Periodic Bit-Stream Sequences. DELTA 2004: 372-377 - [c5]Soumendu Bhattacharya, Abhijit Chatterjee:
Use of Embedded Sensors for Built-In-Test of RF Circuits. ITC 2004: 801-809 - [c4]Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Achintya Halder, Abhijit Chatterjee:
System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams. VTS 2004: 229-236 - 2003
- [c3]Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee:
Automatic Multitone Alternate Test Generation For RF Circuits Using Behavioral Models. ITC 2003: 665-673 - [c2]Soumendu Bhattacharya, Abhijit Chatterjee:
High Coverage Analog Wafer-Probe Test Design and Co-optimization with Assembled-Package Test to Minimize Overall Test Cost. VTS 2003: 89-100 - 2002
- [c1]Soumendu Bhattacharya, Abhijit Chatterjee:
Constrained Specification-Based Test Stimulus Generation for Analog Circuits Using Nonlinear Performance Prediction Models. DELTA 2002: 25-32
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from 
to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the 
of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from 
, 
, and 
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from 
.
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-04-24 22:48 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
