"Low-cost parametric test and diagnosis of RF systems using multi-tone ..."

Donghoon Han, Soumendu Bhattacharya, Abhijit Chatterjee (2007)

> Home

Details and statistics

DOI: 10.1049/IET-CDT:20060145

access: closed

type: Journal Article

metadata version: 2020-07-14

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/iet-cdt/HanBC07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/iet-cdt/HanBC07
Donghoon Han, Soumendu Bhattacharya, Abhijit Chatterjee:
Low-cost parametric test and diagnosis of RF systems using multi-tone response envelope detection. IET Comput. Digit. Tech. 1(3): 170-179 (2007)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.