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"A DFT Approach for Testing Embedded Systems Using DC Sensors."

Soumendu Bhattacharya, Abhijit Chatterjee (2006)

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DOI: 10.1109/MDT.2006.136

access: closed

type: Journal Article

metadata version: 2020-05-17

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  dblp key:
  - journals/dt/BhattacharyaC06
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  persistent URL:
  - https://dblp.org/rec/journals/dt/BhattacharyaC06
Soumendu Bhattacharya, Abhijit Chatterjee:
A DFT Approach for Testing Embedded Systems Using DC Sensors. IEEE Des. Test Comput. 23(6): 464-475 (2006)

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