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ORCIDZahra Paria Najafi-Haghi
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2020 – today
- 2023
[j1]Zahra Paria Najafi-Haghi
, Hans-Joachim Wunderlich:
Identifying Resistive Open Defects in Embedded Cells under Variations. J. Electron. Test. 39(1): 27-40 (2023)- [c8]Zahra Paria Najafi-Haghi, Florian Klemme, Hanieh Jafarzadeh, Hussam Amrouch, Hans-Joachim Wunderlich:
Robust Resistive Open Defect Identification Using Machine Learning with Efficient Feature Selection. DATE 2023: 1-2 - [c7]Hanieh Jafarzadeh, Florian Klemme, Jan Dennis Reimer, Zahra Paria Najafi-Haghi, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich:
Robust Pattern Generation for Small Delay Faults Under Process Variations. ITC 2023: 111-116 - [c6]Hans-Joachim Wunderlich, Hanieh Jafarzadeh, Alexandra Kourfali, Natalia Lylina, Zahra Paria Najafi-Haghi:
Test Aspects of System Health State Monitoring. LATS 2023: 1-2 - 2022
- [c5]Hussam Amrouch, Jens Anders, Steffen Becker, Maik Betka, Gerd Bleher, Peter Domanski, Nourhan Elhamawy, Thomas Ertl, Athanasios Gatzastras, Paul R. Genssler, Sebastian Hasler, Martin Heinrich, André van Hoorn, Hanieh Jafarzadeh, Ingmar Kallfass, Florian Klemme, Steffen Koch, Ralf Küsters, Andrés Lalama, Raphaël Latty, Yiwen Liao, Natalia Lylina, Zahra Paria Najafi-Haghi, Dirk Pflüger, Ilia Polian, Jochen Rivoir, Matthias Sauer, Denis Schwachhofer, Steffen Templin, Christian Volmer, Stefan Wagner, Daniel Weiskopf, Hans-Joachim Wunderlich, Bin Yang, Martin Zimmermann:
Intelligent Methods for Test and Reliability. DATE 2022: 969-974 - [c4]Zahra Paria Najafi-Haghi, Florian Klemme, Hussam Amrouch, Hans-Joachim Wunderlich:
On Extracting Reliability Information from Speed Binning. ETS 2022: 1-4 - [c3]Yiwen Liao, Zahra Paria Najafi-Haghi, Hans-Joachim Wunderlich, Bin Yang:
Efficient and Robust Resistive Open Defect Detection Based on Unsupervised Deep Learning. ITC 2022: 185-193 - 2021
- [c2]Zahra Paria Najafi-Haghi, Hans-Joachim Wunderlich:
Resistive Open Defect Classification of Embedded Cells under Variations. LATS 2021: 1-6 - 2020
- [c1]Zahra Paria Najafi-Haghi, Marzieh Hashemipour-Nazari, Hans-Joachim Wunderlich:
Variation-Aware Defect Characterization at Cell Level. ETS 2020: 1-6
Coauthor Index
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