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ORCIDJournal of Electronic Testing, Volume 39
Volume 39, Number 1, February 2023
- Vishwani D. Agrawal:
Editorial. 1-2 - Journal of Electronic Testing: Theory and Applications New Editors - 2023. 3-4
- 2022 Reviewers. 5-6
- Test Technology Newsletter. 7-9
- Bahareh Asadi
, Syed Maqsood Zia, Hamza Mohammed Ridha Al-Khafaji, Asghar Mohamadian:
Network-on-Chip and Photonic Network-on-Chip Basic Concepts: A Survey. 11-25 - Zahra Paria Najafi-Haghi, Hans-Joachim Wunderlich:
Identifying Resistive Open Defects in Embedded Cells under Variations. 27-40 - Wenrun Xiao, Jidong Diao, Yanping Qiao, Xianming Liu, Shan He, Donghui Guo:
Refined Self-calibration of an Inductorless Low-noise Amplifier with Non-intrusive Circuit. 41-55 - Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing. 57-69 - Xiaozhi Du, Jinjin Zhang, Kai Chen, Yanrong Zhou:
DFS-KeyLevel: A Two-Layer Test Scenario Generation Approach for UML Activity Diagram. 71-88 - Sourav Ghosh, Surajit Kumar Roy, Chandan Giri:
Fault Detection and Diagnosis of DMFB Using Concurrent Electrodes Actuation. 89-102 - Jake Elliot, Jason Brown:
An Investigation into the Failure Characteristics of External PCB Traces with Different Angle Bends. 103-110 - Raghavendra Kumar Sakali, Sk. Noor Mahammad:
Intrinsic Based Self-healing Adder Design Using Chromosome Reconstruction Algorithm. 111-122
Volume 39, Number 2, April 2023
- Vishwani D. Agrawal:
Editorial. 123 - Test Technology Newsletter. 125-127
- Wenjing Tang, Jing Su, Yuchan Gao:
Hardware Trojan Detection Method Based on Dual Discriminator Assisted Conditional Generation Adversarial Network. 129-140 - Naveenkumar R, N. M. Sivamangai, Napolean A, S. Sridevi Sathya Priya, S. V. Ashika:
Design of INV/BUFF Logic Locking For Enhancing the Hardware Security. 141-153 - Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre:
On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits. 155-170 - Tommaso Melis, Emmanuel Simeu, Etienne Auvray, Luc Saury:
Light Emission Tracking and Measurements for Analog Circuits Fault Diagnosis in Automotive Applications. 171-187 - Tai Song, Zhengfeng Huang, Xiaohui Guo, Krstic Milos:
Cost-Effective Path Delay Defect Testing Using Voltage/Temperature Analysis Based on Pattern Permutation. 189-205 - Chung-Huang Yeh, Jwu E. Chen:
Multiple Retest Systems for Screening High-Quality Chips. 207-225 - Hui Jiang, Fanchen Zhang, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas:
Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift. 227-243 - Ahmad Menbari, Hadi Jahanirad:
A Tunable Concurrent BIST Design Based on Reconfigurable LFSR. 245-262
Volume 39, Number 3, June 2023
- Vishwani D. Agrawal:
Editorial. 263-264 - Test Technology Newsletter. 265-266
- Benedikt Jooß, Dieter Schramm:
Modular Test Kit - A Modular Approach for Efficient and Function-Oriented Testing. 267-274 - Karine Coulié, Hassen Aziza, Wenceslas Rahajandraibe:
Investigation of Single Event Effects in a Resistive RAM Memory Array by Coupling TCAD and SPICE Simulations. 275-288 - Zhengfeng Huang, Hao Wang, Dongxing Ma, Huaguo Liang, Yiming Ouyang, Aibin Yan:
Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node Upsets. 289-301 - Sabyasachi Deyati, Barry John Muldrey, Abhijit Chatterjee:
BISCC: A Novel Approach to Built In State Consistency Checking For Quick Volume Validation of Mixed-Signal/RF Systems. 303-322 - Pradeep Kumar Biswal:
A Flexible Concurrent Testing Scheme for Non-Feedback and Feedback Bridging Faults in Integrated Circuits. 323-346 - Bahman Arasteh, Farhad Soleimanian Gharehchopogh, Peri Gunes, Farzad Kiani, Mahsa Torkamanian-Afshar:
A Novel Metaheuristic Based Method for Software Mutation Test Using the Discretized and Modified Forrest Optimization Algorithm. 347-370 - Vijaypal Singh Rathor, Deepak Singh, Simranjit Singh, Mohit Sajwan:
Multi-Objective Optimization Based Test Pattern Generation for Hardware Trojan Detection. 371-385 - Kunwer Mrityunjay Singh, Jatindra Kumar Deka, Santosh Biswas:
Incomplete Testing of SOC. 387-402
Volume 39, Number 4, August 2023
- Vishwani D. Agrawal:
Editorial. 403-404 - Test Technology Newsletter. 405-407
- Tiago R. Balen, Carlos J. González, Ingrid F. V. Oliveira, Leomar S. da Rosa Jr., Rafael Iankowski Soares, Rafael B. Schvittz, Nemitala Added, Eduardo L. A. Macchione, Vitor A. P. Aguiar, Marcilei Aparecida Guazzelli, Nilberto H. Medina, Paulo F. Butzen:
Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems. 409-420 - R. Saravana Ram, M. Lordwin Cecil Prabhaker:
Diagnosis of Analog and Digital Circuit Faults Using Exponential Deep Learning Neural Network. 421-433 - Tianyi Shao, Bohua Wei, Yu Ou, Yongzhuang Wei, Xiaonian Wu:
New Second-order Threshold Implementation of Sm4 Block Cipher. 435-445 - Tapobrata Dhar, Ranit Das, Chandan Giri, Surajit Kumar Roy:
Threshold Analysis Using Probabilistic Xgboost Classifier for Hardware Trojan Detection. 447-463 - Richa Sharma, G. K. Sharma, Manisha Pattanaik, V. S. S. Prashant:
Structural and SCOAP Features Based Approach for Hardware Trojan Detection Using SHAP and Light Gradient Boosting Model. 465-485 - Shyue-Kung Lu, Zeng-Long Tsai:
E3C Techniques for Protecting NAND Flash Memories. 487-500 - Vinod S. Chippalkatti, Rajashekhar C. Biradar, Venkatesh Shenoy, P. Udayakumar:
Efficient Test and Characterization of Space Transmit-Receive Modules Using Scalable and Multipurpose Automated Test System. 501-519 - Ling Zhang:
Online Diagnosis and Self-Recovery of Faulty Cells in Daisy-Chained MEDA Biochips Using Functional Actuation Patterns. 521-534
Volume 39, Number 5, December 2023
- Vishwani D. Agrawal:
Editorial. 535-536 - 2022 JETTA-TTTC Best Paper Award. 537-538
- Test Technology Newsletter. 539-540
- Gayathri Lakshmi, V. Udaya Sankar, Y. Siva Sankar:
A Survey of PCB Defect Detection Algorithms. 541-554 - Priyajit Bhattacharya, Rahul Bhattacharya, Himasree Deka:
MATLAB-Open Source Tool Based Framework for Test Generation for Digital Circuits Using Evolutionary Algorithms. 555-570 - Asma Iqbal, Syed Affan Daimi, Kamsali Manjunatha Chari:
Performance Efficient and Fault Tolerant Approximate Adder. 571-582 - Zhenyu Zhao, Xin Chen, Yufan Lu:
Trade-off Mechanism Between Reliability and Performance for Data-flow Soft Error Detection. 583-595 - Yingchun Xiao, Feng Zhu, Shengxian Zhuang, Yang Yang:
Identification of Unknown Electromagnetic Interference Sources Based on Siamese-CNN. 597-609 - Joseph Herbert Mitchell-Moreno, Guillermo Espinosa Flores-Verdad:
A Low Bit Instability CMOS PUF Based on Current Mirrors and WTA Cells. 611-620 - Shouhong Chen, Tao Wang, Zhentao Huang, Xingna Hou:
Detection Method of Hardware Trojan Based on Attention Mechanism and Residual-Dense-Block under the Markov Transition Field. 621-629 - Zeinab Asghari, Bahman Arasteh, Abbas Koochari:
Effective Software Mutation-Test Using Program Instructions Classification. 631-657 - J. Paul Rajasingh, P. Senthil Kumar, S. Srinivasan:
Efficient Fault Detection by Test Case Prioritization via Test Case Selection. 659-677
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