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"Robust Pattern Generation for Small Delay Faults Under Process Variations."

Hanieh Jafarzadeh et al. (2023)

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DOI: 10.1109/ITC51656.2023.00026

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-09

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  dblp key:
  - conf/itc/JafarzadehKRNAH23
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  - https://dblp.org/rec/conf/itc/JafarzadehKRNAH23
Hanieh Jafarzadeh, Florian Klemme, Jan Dennis Reimer, Zahra Paria Najafi-Haghi, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich:
Robust Pattern Generation for Small Delay Faults Under Process Variations. ITC 2023: 111-116

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