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ORCIDLothar Frey
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Journal Articles
- 2018
[j10]T. H. Nouibat, Zitouni Messai
, D. Chikouch, Zahir Ouennoughi, N. Rouag, Mathias Rommel, Lothar Frey:
Normalized differential conductance to study current conduction mechanisms in MOS structures. Microelectron. Reliab. 91: 183-187 (2018)- 2017
- [j9]Maiko Girschikofsky, Manuel Rosenberger, Michael Förthner, Mathias Rommel, Lothar Frey, Ralf Hellmann:
Waveguide Bragg Gratings in Ormocer®s for Temperature Sensing. Sensors 17(11): 2459 (2017) - 2015
- [j8]N. Rouag, Zahir Ouennoughi, Mathias Rommel, Katsuhisa Murakami, Lothar Frey:
Current conduction mechanism of MIS devices using multidimensional minimization system program. Microelectron. Reliab. 55(7): 1028-1034 (2015) - 2014
- [j7]M. Fuegl, G. Mackh, Elke Meissner, Lothar Frey:
Analytical stress characterization after different chip separation methods. Microelectron. Reliab. 54(9-10): 1735-1740 (2014) - 2013
- [j6]Zahir Ouennoughi, C. Strenger, F. Bourouba, V. Haeublein, Heiner Ryssel, Lothar Frey:
Conduction mechanisms in thermal nitride and dry gate oxides grown on 4H-SiC. Microelectron. Reliab. 53(12): 1841-1847 (2013) - 2011
- [j5]Martin Le-Huu, Holger Schmitt, Stefan Noll, Michael Grieb, Frederik F. Schrey, Anton J. Bauer, Lothar Frey, Heiner Ryssel:
Investigation of the reliability of 4H-SiC MOS devices for high temperature applications. Microelectron. Reliab. 51(8): 1346-1350 (2011) - [j4]Guntrade Roll, Matthias Goldbach, Lothar Frey:
Leakage current and defect characterization of p+n-source/drain diodes. Microelectron. Reliab. 51(12): 2081-2085 (2011) - 2005
- [j3]Martin Lemberger, Albena Paskaleva, Stefan Zürcher, Anton J. Bauer, Lothar Frey, Heiner Ryssel:
Electrical properties of hafnium silicate films obtained from a single-source MOCVD precursor. Microelectron. Reliab. 45(5-6): 819-822 (2005) - 2003
- [j2]Albena Paskaleva, Martin Lemberger, Stefan Zürcher, Anton J. Bauer, Lothar Frey, Heiner Ryssel:
Electrical characterization of zirconium silicate films obtained from novel MOCVD precursors. Microelectron. Reliab. 43(8): 1253-1257 (2003) - 2001
- [j1]Michael P. M. Jank, Martin Lemberger, Anton J. Bauer, Lothar Frey, Heiner Ryssel:
Electrical reliability aspects of through the gate implanted MOS structures with thin oxides. Microelectron. Reliab. 41(7): 987-990 (2001)
Conference and Workshop Papers
- 2017
- [c5]Alicia Zörner, Susanne Oertel, Björn Schmitz, Nadine Lang, Michael P. M. Jank, Lothar Frey:
Determination of the Selectivity of Printed Wearable Sweat Sensors. BIODEVICES 2017: 81-87 - 2016
- [c4]Susanne Oertel, Michael P. M. Jank, Lothar Frey, Christian Hofmann, Nadine Lang, Matthias Struck:
Screen-printed Biochemical Sensors for Detection of Ammonia Levels in Sweat - Towards Integration with Vital Parameter Monitoring Sports Gear. BIODEVICES 2016: 160-165 - 2015
- [c3]Vincent R. H. Lorentz, Radu Schwarz, T. Heckel, Martin März, Lothar Frey:
Integrated galvanically isolated MOSFET and IGBT gate-driver circuit with switching speed control. IECON 2015: 544-549 - 2014
- [c2]M. T. Niedermeier, Martin M. Wenger, Radu Filimon, V. O. Sedlacek, Vincent R. H. Lorentz, C. Fort, Martin März, Jean-Paul Ferrieux, Lothar Frey:
Galvanically isolated differential data transmission using capacitive coupling and a modified Manchester algorithm for smart power converters. ISIE 2014: 2596-2600 - 2012
- [c1]Vincent R. H. Lorentz, Martin M. Wenger, Joshua L. Grosch, Martin Giegerich, Michael P. M. Jank, Martin März, Lothar Frey:
Novel cost-efficient contactless distributed monitoring concept for smart battery cells. ISIE 2012: 1342-1347
Coauthor Index
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