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"Conduction mechanisms in thermal nitride and dry gate oxides grown on 4H-SiC."

Zahir Ouennoughi et al. (2013)

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DOI: 10.1016/J.MICROREL.2013.06.009

access: closed

type: Journal Article

metadata version: 2023-11-13

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  - https://dblp.org/rec/journals/mr/OuennoughiSBHRF13
Zahir Ouennoughi, C. Strenger, F. Bourouba, V. Haeublein, Heiner Ryssel, Lothar Frey:
Conduction mechanisms in thermal nitride and dry gate oxides grown on 4H-SiC. Microelectron. Reliab. 53(12): 1841-1847 (2013)

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