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ORCIDAlbert J. P. Theuwissen
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2020 – today
- 2023
[j13]Accel Abarca, Albert Theuwissen:
A CMOS Image Sensor Dark Current Compensation Using In-Pixel Temperature Sensors. Sensors 23(22): 9109 (2023)- [c27]Jaekyum Lee, Albert Theuwissen:
A linearity improvement method for CIS column-parallel SAR ADC using two-step conversion. ESSCIRC 2023: 493-496 - 2022
- [c26]Jaekyum Lee, Albert Theuwissen:
An offset calibration technique for CIS column-parallel SAR ADCs using memory. Imaging Sensors and Systems 2022: 1-6 - 2021
- [c25]Albert Theuwissen:
1.4 There's More to the Picture Than Meets the Eye*, and in the future it will only become more so. ISSCC 2021: 30-35 - 2020
- [j12]Shuang Xie, Albert Theuwissen:
A CMOS image sensor with a 10 MHz column readout speed using digitally calibrated pipelined ADCs. Microelectron. J. 99: 104758 (2020) - [j11]Shuang Xie
, Accel Abarca Prouza, Albert Theuwissen:
A CMOS-Imager-Pixel-Based Temperature Sensor for Dark Current Compensation. IEEE Trans. Circuits Syst. II Express Briefs 67-II(2): 255-259 (2020) - [j10]Shuang Xie, Albert Theuwissen:
A 10 Bit 5 MS/s Column SAR ADC With Digital Error Correction for CMOS Image Sensors. IEEE Trans. Circuits Syst. II Express Briefs 67-II(6): 984-988 (2020)
2010 – 2019
- 2019
- [j9]Shuang Xie, Albert Theuwissen:
Compensation for Process and Temperature Dependency in a CMOS Image Sensor. Sensors 19(4): 870 (2019) - [j8]Fei Wang, Albert J. P. Theuwissen:
Pixel Optimizations and Digital Calibration Methods of a CMOS Image Sensor Targeting High Linearity. IEEE Trans. Circuits Syst. I Regul. Pap. 66-I(3): 930-940 (2019) - [c24]Shuang Xie, Xiaoliang Ge, Albert Theuwissen:
Temperature Sensors Incorporated into a CMOS Image Sensor with Column Zoom ADCs. ISCAS 2019: 1-5 - [c23]Shuang Xie, Albert Theuwissen:
A CMOS Image Sensor with Improved Readout Speed using Column SAR ADC with Digital Error Correction. ISCAS 2019: 1-5 - 2018
- [j7]Fei Wang, Liqiang Han, Albert J. P. Theuwissen:
Development and Evaluation of a Highly Linear CMOS Image Sensor With a Digitally Assisted Linearity Calibration. IEEE J. Solid State Circuits 53(10): 2970-2981 (2018) - [j6]Xiaoliang Ge, Albert J. P. Theuwissen:
Temporal Noise Analysis of Charge-Domain Sampling Readout Circuits for CMOS Image Sensors. Sensors 18(3): 707 (2018) - [c22]Fei Wang, Albert Theuwissen:
Two calibration methods to improve the linearity of a CMOS image sensor. IMSE 2018: 1-5 - 2017
- [c21]Fei Wang, Albert Theuwissen:
Linearity analysis of a CMOS image sensor. IMSE 2017: 84-90 - [c20]Shuang Xie, Accel Abarca, Jules Markenhof, Xiaoliang Ge, Albert Theuwissen:
Analysis and calibration of process variations for an array of temperature sensors. IEEE SENSORS 2017: 1-3 - 2016
- [c19]Xiaoliang Ge, Bastien Mamdy, Albert Theuwissen:
A comparative noise analysis and measurement for n-type and p-type pixels with CMS technique. IMSE 2016: 1-6 - [c18]Xiaoliang Ge, Albert Theuwissen:
A CMOS image sensor with nearly unity-gain source follower and optimized column amplifier. IEEE SENSORS 2016: 1-3 - 2014
- [c17]Yusuke Oike, Makoto Ikeda, Albert Theuwissen, Johannes Solhusvik, Jonathan Chang, Tadahiro Kuroda:
F2: 3D stacking technologies for image sensors and memories. ISSCC 2014: 512-513 - 2013
- [b1]Mukul Sarkar, Albert Theuwissen:
A Biologically Inspired CMOS Image Sensor. Studies in Computational Intelligence 461, Springer 2013, ISBN 978-3-642-34900-3, pp. 1-252 - [j5]Ning Xie, Albert J. P. Theuwissen:
Low-power high-accuracy micro-digital sun sensor by means of a CMOS image sensor. J. Electronic Imaging 22(3): 033030 (2013) - [c16]Makoto Ikeda, Ehsan Afshari, Yusuke Oike, David Ruffieux, Johannes Solhusvik, Albert Theuwissen:
F4: Scientific imaging. ISSCC 2013: 506-507 - 2012
- [c15]Yue Chen, Yang Xu, Youngcheol Chae, Adri Mierop, Xinyang Wang, Albert Theuwissen:
A 0.7e-rms-temporal-readout-noise CMOS image sensor for low-light-level imaging. ISSCC 2012: 384-386 - [c14]Makoto Ikeda, Albert Theuwissen, Johannes Solhusvik, Jan T. Bosiers:
Computational imaging. ISSCC 2012: 504-505 - 2011
- [j4]Mukul Sarkar, David San Segundo Bello, Chris Van Hoof, Albert J. P. Theuwissen:
Integrated Polarization-Analyzing CMOS Image Sensor for Detecting the Incoming Light Ray Direction. IEEE Trans. Instrum. Meas. 60(8): 2759-2767 (2011) - [c13]Gayathri G. Nampoothiri, Marc L. R. Horemans, Albert J. P. Theuwissen:
Ageing effects on image sensors due to terrestrial cosmic radiation. Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications 2011: 78750G - [c12]Johannes Solhusvik, Albert Theuwissen, Sam Kavusi, Tetsuo Nomoto, Iliana Chen:
Image sensors for 3D capture. ISSCC 2011: 520-521 - 2010
- [c11]Mukul Sarkar, David San Segundo Bello, Chris Van Hoof, Albert J. P. Theuwissen:
Integrated polarization analyzing CMOS Image sensor for autonomus navigation using polarized light. IEEE Conf. of Intelligent Systems 2010: 224-229 - [c10]Mukul Sarkar, David San Segundo Bello, Chris Van Hoof, Albert J. P. Theuwissen:
Integrated polarization-analyzing CMOS image sensor. ISCAS 2010: 621-624
2000 – 2009
- 2008
- [c9]Xinyang Wang, Martijn F. Snoeij, Padmakumar R. Rao, Adri Mierop, Albert J. P. Theuwissen:
A CMOS Image Sensor with a Buried-Channel Source Follower. ISSCC 2008: 62-63 - [c8]Albert Theuwissen, Roland Thewes, Ernesto Perea:
Highlights of IEDM 2007. ISSCC 2008: 392-393 - [c7]Albert Theuwissen:
Wide Dynamic Range Imaging (Forum). ISSCC 2008: 652-653 - 2007
- [j3]Martijn F. Snoeij, Albert J. P. Theuwissen, Kofi A. A. Makinwa, Johan H. Huijsing:
Multiple-Ramp Column-Parallel ADC Architectures for CMOS Image Sensors. IEEE J. Solid State Circuits 42(12): 2968-2977 (2007) - [c6]Albert Theuwissen:
CMOS image sensors: State-of-the-art and future perspectives. ESSCIRC 2007: 21-27 - [c5]Albert Theuwissen, Ernesto Perea:
SE5 Highlights of IEDM 2006. ISSCC 2007: 370-371 - [c4]Martijn F. Snoeij, P. Donegan, Albert J. P. Theuwissen, Kofi A. A. Makinwa, Johan H. Huijsing:
A CMOS Image Sensor with a Column-Level Multiple-Ramp Single-Slope ADC. ISSCC 2007: 506-618 - 2006
- [j2]Martijn F. Snoeij, Albert J. P. Theuwissen, Kofi A. A. Makinwa, Johan H. Huijsing:
A CMOS Imager With Column-Level ADC Using Dynamic Column Fixed-Pattern Noise Reduction. IEEE J. Solid State Circuits 41(12): 3007-3015 (2006) - [c3]Martijn F. Snoeij, Albert Theuwissen, Kofi A. A. Makinwa, Johan H. Huijsing:
A CMOS Imager with Column-Level ADC Using Dynamic Column FPN Reduction. ISSCC 2006: 2014-2023 - 2005
- [c2]Martijn F. Snoeij, Albert J. P. Theuwissen, Johan H. Huijsing:
A 1.8 V 3.2µW comparator for use in a CMOS imager column-level single-slope ADC. ISCAS (6) 2005: 6162-6165 - 2002
- [c1]Albert J. P. Theuwissen:
Small is Beautiful! Yes, But Also for Pixels of Digital Still Cameras? PICS 2002: 156-157
1990 – 1999
- 1998
- [j1]H.-S. Philip Wong, Albert J. P. Theuwissen:
Digital Imaging. IEEE Micro 18(6): 12-13 (1998)
Coauthor Index
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