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"A comparative noise analysis and measurement for n-type and p-type pixels ..."

Xiaoliang Ge, Bastien Mamdy, Albert Theuwissen (2016)

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DOI: 10.2352/ISSN.2470-1173.2016.12.IMSE-282

access: open

type: Conference or Workshop Paper

metadata version: 2023-07-27

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  dblp key:
  - conf/ei-iss/GeMT16
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Xiaoliang Ge, Bastien Mamdy, Albert Theuwissen:
A comparative noise analysis and measurement for n-type and p-type pixels with CMS technique. IMSE 2016: 1-6

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