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Xrysovalantis Kavousianos
Publications
- 2018
- [j22]Panagiotis Georgiou, Fotis Vartziotis, Xrysovalantis Kavousianos, Krishnendu Chakrabarty:
Testing 3D-SoCs Using 2-D Time-Division Multiplexing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(12): 3177-3185 (2018) - 2017
- [j21]Fotis Vartziotis, Xrysovalantis Kavousianos, Panagiotis Georgiou, Krishnendu Chakrabarty:
A Branch-&-Bound Test-Access-Mechanism Optimization Method for Multi-Vdd SoCs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(11): 1911-1924 (2017) - 2016
- [c42]Panagiotis Georgiou, Fotios Vartziotis, Xrysovalantis Kavousianos, Krishnendu Chakrabarty:
Two-dimensional time-division multiplexing for 3D-SoCs. ETS 2016: 1-6 - 2015
- [j20]Fotis Vartziotis, Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Arvind Jain, Rubin A. Parekhji:
Time-Division Multiplexing for Testing DVFS-Based SoCs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(4): 668-681 (2015) - [c41]Fotios Vartziotis, Xrysovalantis Kavousianos, Krishnendu Chakrabarty:
A branch-&-bound algorithm for TAM optimization in multi-Vdd SoCs. ETS 2015: 1-2 - [c40]Fotios Vartziotis, Xrysovalantis Kavousianos, Panagiotis Georgiou, Krishnendu Chakrabarty:
Test-access-mechanism optimization for multi-Vdd SoCs. ITC 2015: 1-10 - 2014
- [j18]Ran Wang, Zhaobo Zhang, Xrysovalantis Kavousianos, Yiorgos Tsiatouhas, Krishnendu Chakrabarty:
Built-In Self-Test, Diagnosis, and Repair of MultiMode Power Switches. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(8): 1231-1244 (2014) - [j17]Zhaobo Zhang, Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Yiorgos Tsiatouhas:
Static Power Reduction Using Variation-Tolerant and Reconfigurable Multi-Mode Power Switches. IEEE Trans. Very Large Scale Integr. Syst. 22(1): 13-26 (2014) - [c39]Fotis Vartziotis, Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Rubin A. Parekhji, Arvind Jain:
Multi-site test optimization for multi-Vdd SoCs using space- and time- division multiplexing. DATE 2014: 1-6 - [c38]Xrysovalantis Kavousianos, Krishnendu Chakrabarty:
Recent advances in single- and multi-site test optimization for DVS-based SoCs. DTIS 2014: 1-6 - 2013
- [c37]Xrysovalantis Kavousianos, Krishnendu Chakrabarty:
Testing for SoCs with advanced static and dynamic power-management capabilities. DATE 2013: 737-742 - 2012
- [j15]Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Arvind Jain, Rubin A. Parekhji:
Test Schedule Optimization for Multicore SoCs: Handling Dynamic Voltage Scaling and Multiple Voltage Islands. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(11): 1754-1766 (2012) - [c36]Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Arvind Jain, Rubin A. Parekhji:
Time-division multiplexing for testing SoCs with DVS and multiple voltage islands. ETS 2012: 1-6 - 2011
- [j14]Xrysovalantis Kavousianos, Krishnendu Chakrabarty:
Generation of Compact Stuck-At Test Sets Targeting Unmodeled Defects. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(5): 787-791 (2011) - [j13]Xrysovalantis Kavousianos, Vasileios Tenentes, Krishnendu Chakrabarty, Emmanouil Kalligeros:
Defect-Oriented LFSR Reseeding to Target Unmodeled Defects Using Stuck-at Test Sets. IEEE Trans. Very Large Scale Integr. Syst. 19(12): 2330-2335 (2011) - [c35]Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Arvind Jain, Rubin A. Parekhji:
Test Scheduling for Multicore SoCs with Dynamic Voltage Scaling and Multiple Voltage Islands. Asian Test Symposium 2011: 33-39 - [c33]Zhaobo Zhang, Xrysovalantis Kavousianos, Yan Luo, Yiorgos Tsiatouhas, Krishnendu Chakrabarty:
Signature Analysis for Testing, Diagnosis, and Repair of Multi-mode Power Switches. ETS 2011: 13-18 - [c31]Zhaobo Zhang, Xrysovalantis Kavousianos, Yiorgos Tsiatouhas, Krishnendu Chakrabarty:
A BIST scheme for testing and repair of multi-mode power switches. IOLTS 2011: 115-120 - [c30]Zhaobo Zhang, Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Yiorgos Tsiatouhas:
A Robust and Reconfigurable Multi-mode Power Gating Architecture. VLSI Design 2011: 280-285 - 2010
- [c29]Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Emmanouil Kalligeros, Vasileios Tenentes:
Defect Coverage-Driven Window-Based Test Compression. Asian Test Symposium 2010: 141-146 - [c28]S. Balatsouka, Vasileios Tenentes, Xrysovalantis Kavousianos, Krishnendu Chakrabarty:
Defect aware X-filling for low-power scan testing. DATE 2010: 873-878 - 2009
- [c25]Xrysovalantis Kavousianos, Krishnendu Chakrabarty:
Generation of compact test sets with high defect coverage. DATE 2009: 1130-1135
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