![](https://dblp1.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp1.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp1.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp1.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp1.uni-trier.de/img/search.dark.16x16.png)
default search action
Defect and Fault Tolerance in VLSI [and Nanotechnology] Systems
38th DFT 2023: Juan-Les-Pins, France
- Luca Cassano, Mihalis Psarakis, Marcello Traiola, Alberto Bosio:
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023. IEEE 2023, ISBN 979-8-3503-1500-4 [contents]
37th DFT 2022: Austin, TX, USA
- Luca Cassano, Sreejit Chakravarty, Alberto Bosio:
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022. IEEE 2022, ISBN 978-1-6654-5938-9 [contents]
36th DFT 2021: Athens, Greece
- Luigi Dilillo, Luca Cassano, Athanasios Papadimitriou:
36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021. IEEE 2021, ISBN 978-1-6654-1609-2 [contents]
35th DFT 2020: Frascati, Italy
- Luigi Dilillo, Mihalis Psarakis, Taniya Siddiqua:
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020. IEEE 2020, ISBN 978-1-7281-9457-8 [contents]
34th DFT 2019: Noordwijk, The Netherlands
- 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019. IEEE 2019, ISBN 978-1-7281-2260-1 [contents]
33rd DFT 2018: Chicago, IL, USA
- 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018. IEEE Computer Society 2018, ISBN 978-1-5386-8398-9 [contents]
32nd DFT 2017: Cambridge, UK
- IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017. IEEE Computer Society 2017, ISBN 978-1-5386-0362-8 [contents]
31st DFT 2016: Storrs, CT, USA
- 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016. IEEE Computer Society 2016, ISBN 978-1-5090-3623-3 [contents]
30th DFTS 2015: Amherst, MA, USA
- 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015, Amherst, MA, USA, October 12-14, 2015. IEEE Computer Society 2015, ISBN 978-1-4799-8606-4 [contents]
29th DFT 2014: Amsterdam, The Netherlands
- 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014. IEEE Computer Society 2014, ISBN 978-1-4799-6155-9 [contents]
28th DFT 2013: New York City, NY, USA
- 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2013, New York City, NY, USA, October 2-4, 2013. IEEE Computer Society 2013 [contents]
27th DFT 2012: Austin, TX, USA
- 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012. IEEE Computer Society 2012, ISBN 978-1-4673-3043-5 [contents]
26th DFT 2011: Vancouver, BC, Canada
- 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011. IEEE Computer Society 2011, ISBN 978-1-4577-1713-0 [contents]
25th DFT 2010: Kyoto, Japan
- 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010. IEEE Computer Society 2010, ISBN 978-1-4244-8447-8 [contents]
24th DFT 2009: Chicago, Illinois, USA
- Dimitris Gizopoulos, Susumu Horiguchi, Spyros Tragoudas, Mohammad Tehranipoor:
24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009, Chicago, Illinois, USA, October 7-9, 2009. IEEE Computer Society 2009, ISBN 978-0-7695-3839-6 [contents]
23rd DFT 2008: Boston, MA, USA
- Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, Mohammad Tehranipoor:
23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA. IEEE Computer Society 2008, ISBN 978-0-7695-3365-0 [contents]
22nd DFT 2007: Rome, Italy
- Cristiana Bolchini, Yong-Bin Kim, Adelio Salsano, Nur A. Touba:
22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy. IEEE Computer Society 2007, ISBN 0-7695-2885-6 [contents]
21st DFT 2006: Arlington, Virginia, USA
- 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA. IEEE Computer Society 2006, ISBN 0-7695-2706-X [contents]
20th DFT 2005: Monterey, CA, USA
- 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA. IEEE Computer Society 2005, ISBN 0-7695-2464-8 [contents]
19th DFT 2004: Cannes, France
- 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings. IEEE Computer Society 2004, ISBN 0-7695-2241-6 [contents]
18th DFT 2003: Boston, MA, USA
- 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings. IEEE Computer Society 2003, ISBN 0-7695-2042-1 [contents]
17th DFT 2002: Vancouver, BC, Canada
- 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings. IEEE Computer Society 2002, ISBN 0-7695-1831-1 [contents]
16th DFT 2001: San Francisco, CA, USA
- 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings. IEEE Computer Society 2001, ISBN 0-7695-1203-8 [contents]
15th DFT 2000: Mt. Fuji, Yamanashi, Japan
- 15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2000), 25-27 October 2000, Yamanashi, Japan, Proceedings. IEEE Computer Society 2000, ISBN 0-7695-0719-0 [contents]
14th DFT 1999: Albuquerque, NM, USA
- 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '99), November 1-3, 1999, Albuquerque, NM, USA, Proceedings. IEEE Computer Society 1999, ISBN 0-7695-0325-X [contents]
13th DFT 1998: Austin, TX, USA
- 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '98), 2-4 November 1998, Austin, TX, USA, Proceedings. IEEE Computer Society 1998, ISBN 0-8186-8832-7 [contents]
12th DFT 1997: Paris, France
- 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT '97), 20-22 October 1997, Paris, France. IEEE Computer Society 1997, ISBN 0-8186-8168-3 [contents]
11th DFT 1996: Boston, MA, USA
- 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 1996, Boston, MA, USA, November 6-8, 1996. IEEE Computer Society 1996, ISBN 0-8186-7545-4 [contents]
10th DFT 1995: Lafayette, LA, USA
- 1995 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 1995, Lafayette, LA, USA, November 13-15, 1995. IEEE Computer Society 1995, ISBN 0-8186-7107-6 [contents]
9th DFT 1994: Montréal, Quebec, Canada
- The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 17-19, 1994, Montréal, Quebec, Canada, Proceedings. IEEE Computer Society 1994, ISBN 0-8186-6307-3 [contents]
8th DFT 1993: Venice, Italy
- Fabrizio Lombardi, Mariagiovanna Sami, Yvon Savaria, Renato Stefanelli:
The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 27-29, 1993, Venice, Italy, Proceedings. IEEE Computer Society 1993, ISBN 0-8186-3502-9 [contents]
![](https://dblp1.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.