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ORCIDTaniya Siddiqua
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2020 – today
- 2020
[e1]Luigi Dilillo, Mihalis Psarakis, Taniya Siddiqua:
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020. IEEE 2020, ISBN 978-1-7281-9457-8 [contents]
2010 – 2019
- 2018
- [c11]Elisabeth Baseman, Nathan DeBardeleben, Sean Blanchard, Juston S. Moore, Olena Tkachenko, Kurt B. Ferreira, Taniya Siddiqua, Vilas Sridharan:
Physics-Informed Machine Learning for DRAM Error Modeling. DFT 2018: 1-6 - [c10]Scott Levy, Kurt B. Ferreira, Nathan DeBardeleben, Taniya Siddiqua, Vilas Sridharan, Elisabeth Baseman:
Lessons learned from memory errors observed over the lifetime of Cielo. SC 2018: 43:1-43:12 - 2017
- [c9]Taniya Siddiqua, Vilas Sridharan, Steven E. Raasch, Nathan DeBardeleben, Kurt B. Ferreira, Scott Levy, Elisabeth Baseman, Qiang Guan:
Lifetime memory reliability data from the field. DFT 2017: 1-6 - [c8]Elisabeth Baseman, Nathan DeBardeleben, Kurt B. Ferreira, Vilas Sridharan, Taniya Siddiqua, Olena Tkachenko:
Automating DRAM Fault Mitigation By Learning From Experience. DSN Workshops 2017: 137-140 - [c7]Dylan C. Stow, Yuan Xie, Taniya Siddiqua, Gabriel H. Loh:
Cost-effective design of scalable high-performance systems using active and passive interposers. ICCAD 2017: 728-735 - 2016
- [c6]Elisabeth Baseman, Nathan DeBardeleben, Kurt B. Ferreira, Scott Levy, Steven Raasch, Vilas Sridharan, Taniya Siddiqua, Qiang Guan:
Improving DRAM Fault Characterization through Machine Learning. DSN Workshops 2016: 250-253 - 2012
- [j1]Taniya Siddiqua, Sudhanva Gurumurthi:
Enhancing NBTI Recovery in SRAM Arrays Through Recovery Boosting. IEEE Trans. Very Large Scale Integr. Syst. 20(4): 616-629 (2012) - 2011
- [c5]Taniya Siddiqua, Sudhanva Gurumurthi, Mircea R. Stan
:
Modeling and analyzing NBTI in the presence of Process Variation. ISQED 2011: 28-35 - 2010
- [c4]Taniya Siddiqua, Sudhanva Gurumurthi:
A multi-level approach to reduce the impact of NBTI on processor functional units. ACM Great Lakes Symposium on VLSI 2010: 67-72 - [c3]Vidyabhushan Mohan, Taniya Siddiqua, Sudhanva Gurumurthi, Mircea R. Stan:
How I Learned to Stop Worrying and Love Flash Endurance. HotStorage 2010 - [c2]Taniya Siddiqua, Sudhanva Gurumurthi:
Recovery Boosting: A Technique to Enhance NBTI Recovery in SRAM Arrays. ISVLSI 2010: 393-398
2000 – 2009
- 2009
- [c1]Taniya Siddiqua, Sudhanva Gurumurthi:
Balancing soft error coverage with lifetime reliability in redundantly multithreaded processors. MASCOTS 2009: 1-12
Coauthor Index
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