![](https://dblp1.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp1.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp1.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp1.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp1.uni-trier.de/img/search.dark.16x16.png)
default search action
Search dblp
Full-text search
- > Home
Please enter a search query
- case-insensitive prefix search: default
e.g., sig matches "SIGIR" as well as "signal" - exact word search: append dollar sign ($) to word
e.g., graph$ matches "graph", but not "graphics" - boolean and: separate words by space
e.g., codd model - boolean or: connect words by pipe symbol (|)
e.g., graph|network
Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.
Author search results
no matches
Venue search results
no matches
Refine list
refine by author
- no options
- temporarily not available
refine by venue
- no options
- temporarily not available
refine by type
- no options
- temporarily not available
refine by access
- no options
- temporarily not available
refine by year
- no options
- temporarily not available
Publication search results
found 73 matches
- 2020
- Zeye Liu, R. D. Shawn Blanton:
High Defect-Density Yield Learning using Three-Dimensional Logic Test Chips. ITC 2020: 1-10 - Nidhi Agrawal, Min-Jian Yang, Constantinos Xanthopoulos, Vijayakumar Thangamariappan, Joe Xiao, Chee-Wah Ho, Keith Schaub, Ira Leventhal:
Automated Socket Anomaly Detection through Deep Learning. ITC 2020: 1-5 - Sang-Uck Ahn, Beom-Kyu Seo, Hyun-Woo Kim, Yeoun-Sook Shin, Hyung-Tae Kim, Ghil-Geun Oh, Young-Dae Kim:
Cost-Effective Test Method for screening out Unexpected Failure in High Speed Serial Interface IPs. ITC 2020: 1-4 - Muslum Emir Avci, Sule Ozev:
Design Optimization for N-port RF Network Reflectometers under Noise and Gain Imperfections. ITC 2020: 1-10 - Sarah Azimi
, Luca Sterpone:
Digital Design Techniques for Dependable High Performance Computing. ITC 2020: 1-10 - Manu Baby, Bernd Büttner, Piet Engelke, Ulrike Pfannkuchen, Reinhard Meier, Jonathan Gaudet, Jean-François Côté, Givargis Danialy, Martin Keim, Lori Schramm:
IJTAG Through a Two-Pin Chip Interface. ITC 2020: 1-5 - Gabriele Boschi, Elisa Spano, Hayk T. Grigoryan, Arun Kumar, Gurgen Harutyunyan:
Die-to-Die Testing and ECC Error Mitigation in Automotive and Industrial Safety Applications. ITC 2020: 1-6 - Richard Bramley, Yanxiang Huang, Guangshan Duan, Nirmal R. Saxena, Paul Racunas:
On the Measurement of Safe Fault Failure Rates in High-Performance Compute Processors. ITC 2020: 1-10 - David Brauchler, Jennifer Dworak:
Multi-Level Access Protection for Future IEEE P1687.1 IJTAG Networks. ITC 2020: 1-10 - Riccardo Cantoro
, Dario Foti, Sandro Sartoni
, Matteo Sonza Reorda
, Lorena Anghel, Michele Portolan:
New Perspectives on Core In-field Path Delay Test. ITC 2020: 1-5 - Riccardo Cantoro
, Martin Huch, Tobias Kilian, Raffaele Martone, Ulf Schlichtmann, Giovanni Squillero:
Machine Learning based Performance Prediction of Microcontrollers using Speed Monitors. ITC 2020: 1-5 - M. Casarsa, Gurgen Harutyunyan, Yervant Zorian:
Test and Diagnosis Solution for Functional Safety. ITC 2020: 1-5 - Arjun Chaudhuri, Jonti Talukdar
, Fei Su, Krishnendu Chakrabarty
:
Functional Criticality Classification of Structural Faults in AI Accelerators. ITC 2020: 1-5 - Jun Chen, Masanori Hashimoto
:
Proactive Supply Noise Mitigation with Low-Latency Minor Voltage Regulator and Lightweight Current Prediction. ITC 2020: 1-8 - Wei-Hao Chen, Chu-Chun Hsu, Shi-Yu Huang:
Rapid PLL Monitoring By A Novel min-MAX Time-to-Digital Converter. ITC 2020: 1-8 - Siyuan Chen, Jinwook Jung, Peilin Song, Krishnendu Chakrabarty
, Gi-Joon Nam:
BISTLock: Efficient IP Piracy Protection using BIST. ITC 2020: 1-5 - Leon Li-Yang Chen, Katherine Shu-Min Li, Ken Chau-Cheung Cheng
, Sying-Jyan Wang
, Andrew Yi-Ann Huang, Leon Chou, Nova Cheng-Yen Tsai, Chen-Shiun Lee:
TestDNA-E: Wafer Defect Signature for Pattern Recognition by Ensemble Learning. ITC 2020: 1-4 - Sreeja Chowdhury, Rabin Yu Acharya, William Boullion, Andrew Felder, Mark Howard, Jia Di, Domenic Forte
:
A Weak Asynchronous RESet (ARES) PUF Using Start-up Characteristics of Null Conventional Logic Gates. ITC 2020: 1-10 - Chien-Hui Chuang, Kuan-Wei Hou, Cheng-Wen Wu, Mincent Lee, Chia-Heng Tsai, Hao Chen, Min-Jer Wang:
A Deep Learning-Based Screening Method for Improving the Quality and Reliability of Integrated Passive Devices. ITC 2020: 1-9 - Jean-François Côté, Mark Kassab, Wojciech Janiszewski, Ricardo Rodrigues, Reinhard Meier, Bartosz Kaczmarek, Peter Orlando, Geir Eide, Janusz Rajski, Glenn Colón-Bonet, Naveen Mysore, Ya Yin, Pankaj Pant:
Streaming Scan Network (SSN): An Efficient Packetized Data Network for Testing of Complex SoCs. ITC 2020: 1-10 - Steven J. Frederiksen, John Aromando, Michael S. Hsiao:
Automated Assertion Generation from Natural Language Specifications. ITC 2020: 1-5 - Wei Gao, Tao Jing:
Modeling Accuracy of Wideband Power Amplifiers with Memory effects via Measurements. ITC 2020: 1-7 - Vadim Geurkov, Lev Kirischian:
A Unified Method of Designing Signature Analyzers for Digital and Mixed-Signal Circuits Testing. ITC 2020: 1-5 - Ricardo Aquino Guazzelli, Laurent Fesquet:
At-speed DfT Architecture for Bundled-data Design. ITC 2020: 1-9 - Chen He
, Stephen Traynor, Gayathri Bhagavatheeswaran, Hector Sanchez:
Stress, Test, and Simulation of Analog IOs on Automotive ICs. ITC 2020: 1-10 - Chen He
, Yanyao Yu:
Wafer Level Stress: Enabling Zero Defect Quality for Automotive Microcontrollers without Package Burn-In. ITC 2020: 1-10 - Stefan Holst, Matthias Kampmann
, Alexander Sprenger
, Jan Dennis Reimer, Sybille Hellebrand, Hans-Joachim Wunderlich, Xiaoqing Wen:
Logic Fault Diagnosis of Hidden Delay Defects. ITC 2020: 1-10 - Hanbin Hu
, Nguyen Nguyen, Chen He
, Peng Li:
Advanced Outlier Detection Using Unsupervised Learning for Screening Potential Customer Returns. ITC 2020: 1-10 - Qicheng Huang, Chenlei Fang, R. D. Shawn Blanton:
LAIDAR: Learning for Accuracy and Ideal Diagnostic Resolution. ITC 2020: 1-10 - Qicheng Huang, Chenlei Fang, R. D. Shawn Blanton:
Knowledge Transfer for Diagnosis Outcome Preview with Limited Data. ITC 2020: 1-9
skipping 43 more matches
loading more results
failed to load more results, please try again later
![](https://dblp1.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from ,
, and
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and
to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from .
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
retrieved on 2024-07-01 19:15 CEST from data curated by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint