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"Cost-Effective Test Method for screening out Unexpected Failure in High ..."

Sang-Uck Ahn et al. (2020)

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DOI: 10.1109/ITC44778.2020.9325235

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-25

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Sang-Uck Ahn, Beom-Kyu Seo, Hyun-Woo Kim, Yeoun-Sook Shin, Hyung-Tae Kim, Ghil-Geun Oh, Young-Dae Kim:
Cost-Effective Test Method for screening out Unexpected Failure in High Speed Serial Interface IPs. ITC 2020: 1-4

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