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"Stress, Test, and Simulation of Analog IOs on Automotive ICs."

Chen He et al. (2020)

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DOI: 10.1109/ITC44778.2020.9325224

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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  dblp key:
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  - https://dblp.org/rec/conf/itc/HeTBS20
Chen He, Stephen Traynor, Gayathri Bhagavatheeswaran, Hector Sanchez:
Stress, Test, and Simulation of Analog IOs on Automotive ICs. ITC 2020: 1-10

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