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Publication search results
found 71 matches
- 2012
- Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Christophe Kelma:
Experiences with non-intrusive sensors for RF built-in test. ITC 2012: 1-8 - Mukesh Agrawal, Michael Richter, Krishnendu Chakrabarty
:
A dynamic programming solution for optimizing test delivery in multicore SOCs. ITC 2012: 1-10 - Igor Aleksejev
, Artur Jutman
, Sergei Devadze
, Sergei Odintsov
, Thomas Wenzel:
FPGA-based synthetic instrumentation for board test. ITC 2012: 1-10 - Josep Altet
, Diego Mateo
, Didac Gómez, Xavier Perpiñà
, Miquel Vellvehí
, Xavier Jordà
:
DC temperature measurements for power gain monitoring in RF power amplifiers. ITC 2012: 1-8 - Eugene R. Atwood:
"Managing process variance in analog designs". ITC 2012: 1 - Haithem Ayari, Florence Azaïs, Serge Bernard
, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell:
Making predictive analog/RF alternate test strategy independent of training set size. ITC 2012: 1-9 - Rafal Baranowski, Michael A. Kochte, Hans-Joachim Wunderlich:
Modeling, verification and pattern generation for reconfigurable scan networks. ITC 2012: 1-9 - Matthew Beckler
, R. D. (Shawn) Blanton:
On-chip diagnosis for early-life and wear-out failures. ITC 2012: 1-10 - Zoe Conroy:
Are the IC guys helping or hindering board test? ITC 2012: 1 - Zoe Conroy, James J. Grealish, Harrison Miles, Anthony J. Suto, Alfred L. Crouch, Skip Meyers:
Board assisted-BIST: Long and short term solutions for testpoint erosion - Reaching into the DFx toolbox. ITC 2012: 1-10 - Dariusz Czysz, Janusz Rajski, Jerzy Tyszer:
Low power test application with selective compaction in VLSI designs. ITC 2012: 1-10 - Scott Davidson:
Testing high-frequency and low-power designs: Do the standard rules and tools apply? ITC 2012: 1 - Sergej Deutsch, Brion L. Keller, Vivek Chickermane, Subhasish Mukherjee, Navdeep Sood, Sandeep Kumar Goel, Ji-Jan Chen, Ashok Mehta, Frank Lee, Erik Jan Marinissen
:
DfT architecture and ATPG for Interconnect tests of JEDEC Wide-I/O memory-on-logic die stacks. ITC 2012: 1-10 - Weichi Ding, Mingde Pan, Wilson Wong, Daniel Chow, Mike Peng Li, Sergey Y. Shumarayev:
On-die instrumentation to solve challenges for 28nm, 28Gbps timing variability and stressing. ITC 2012: 1-7 - Matthieu Dubois, Emeric de Foucauld, Christopher Mounet, Serigne Dia, Cedric Mayor:
A frequency measurement BIST implementation targeting gigahertz application. ITC 2012: 1-8 - Allan Ecker, Kenneth Blakkan, Mani Soma:
A digital method for phase noise measurement. ITC 2012: 1-10 - Xiaoxin Fan, Huaxing Tang, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Brady Benware:
Improved volume diagnosis throughput using dynamic design partitioning. ITC 2012: 1-10 - Ming Gao, Peter Lisherness, Kwang-Ting (Tim) Cheng
:
Adaptive test selection for post-silicon timing validation: A data mining approach. ITC 2012: 1-7 - Xinli Gu:
Are industrial test problems real problems? I thought research has resolved them all! ITC 2012: 1 - Friedrich Hapke, Michael Reese, Jason Rivers, A. Over, V. Ravikumar, Wilfried Redemund, Andreas Glowatz, Jürgen Schlöffel, Janusz Rajski:
Cell-aware Production test results from a 32-nm notebook processor. ITC 2012: 1-9 - Gerald Hilber, Dominik Gruber, Michael Sams, Timm Ostermann:
Calibration of a flexible high precision Power-On Reset during production test. ITC 2012: 1-7 - Masahiro Ishida, Kiyotaka Ichiyama, Daisuke Watanabe, Masayuki Kawabata, Toshiyuki Okayasu:
Real-time testing method for 16 Gbps 4-PAM signal interface. ITC 2012: 1-10 - Masahiro Ishida, Toru Nakura, Toshiyuki Kikkawa, Takashi Kusaka, Satoshi Komatsu, Kunihiro Asada:
Power integrity control of ATE for emulating power supply fluctuations on customer environment. ITC 2012: 1-10 - Takashi Ito, Hideo Okawara, Jinlei Liu:
RNA: Advanced phase tracking method for digital waveform reconstruction. ITC 2012: 1-9 - Vinayak Kamath, Wen Chen, Nik Sumikawa, Li-C. Wang
:
Functional test content optimization for peak-power validation - An experimental study. ITC 2012: 1-10 - David C. Keezer, Te-Hui Chen, Carl Edward Gray, Hyun Woo Choi, Sungyeol Kim, Seongkwan Lee, Hosun Yoo:
Multi-gigahertz arbitrary timing generator and data pattern serializer/formatter. ITC 2012: 1-11 - Animesh Khare, P. Kishore, S. Reddy, K. Rajan, A. Sanghani:
Methodology for fault grading high speed I/O interfaces used in complex Graphics Processing Unit. ITC 2012: 1-8 - Adam B. Kinsman, Ho Fai Ko, Nicola Nicolici:
In-system constrained-random stimuli generation for post-silicon validation. ITC 2012: 1-10 - Somayeh Sadeghi Kohan, Majid Namaki-Shoushtari, Fatemeh Javaheri, Zainalabedin Navabi:
BS 1149.1 extensions for an online interconnect fault detection and recovery. ITC 2012: 1-9 - Shoji Kojima, Yasuyuki Arai, Tasuku Fujibe, Tsuyoshi Ataka, Atsushi Ono, Ken-ichi Sawada, Daisuke Watanabe:
8Gbps CMOS pin electronics hardware macro with simultaneous bi-directional capability. ITC 2012: 1-9
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