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ORCIDScott Davidson 0001
Person information
- affiliation: Oracle Corp, Santa Clara, CA, USA
- affiliation: AT&T Bell Laboratories, Princeton, NJ, USA
- affiliation (former): Sun Microsystems, Sunnyvale, CA, USA
- affiliation (PhD): University of Louisiana at Lafayette, LA, USA
Other persons with the same name
- Scott Davidson 0003 — Computer Data Systems Inc. (CDSI), Rockville, MD, USA
- Scott Davidson 0004 — University of Washington, Paul G. Allen School of Computer Science & Engineering, Seattle, WA, USA
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2020 – today
- 2024
[j110]Scott Davidson
:
Losing My Memory. IEEE Des. Test 41(1): 95 (2024)- [j109]Scott Davidson:
Predictions. IEEE Des. Test 41(2): 90 (2024) - 2023
- [j108]Scott Davidson:
Training Data Sets: The Source of Our Woes? IEEE Des. Test 40(1): 116 (2023) - [j107]Scott Davidson:
Is There an Answer? IEEE Des. Test 40(2): 139 (2023) - [j106]Scott Davidson:
Our Gated Community. IEEE Des. Test 40(4): 78 (2023) - [j105]Scott Davidson:
Calling Yourself Back. IEEE Des. Test 40(5): 115 (2023) - 2022
- [j104]Scott Davidson:
25 Years (and a Bit More) of The Last Byte. IEEE Des. Test 39(1): 102 (2022) - [j103]Scott Davidson:
The Memory Shuffle. IEEE Des. Test 39(2): 131 (2022) - [j102]Scott Davidson:
Benchmarking Benchmarking. IEEE Des. Test 39(3): 137 (2022) - [j101]Scott Davidson:
Security Arms Race. IEEE Des. Test 39(4): 94 (2022) - [j100]Scott Davidson:
Standing on the Shoulders of ... IEEE Des. Test 39(5): 98 (2022) - [j99]Scott Davidson:
Small Is Good. IEEE Des. Test 39(6): 180 (2022) - 2021
- [j98]Scott Davidson:
Hacking in the Dark. IEEE Des. Test 38(1): 84 (2021) - [j97]Scott Davidson:
The Road to Open-Source EDA. IEEE Des. Test 38(2): 104 (2021) - [j96]Scott Davidson:
Security Begins at Home. IEEE Des. Test 38(3): 128 (2021) - [j95]Scott Davidson:
Being Learned. IEEE Des. Test 38(4): 136 (2021) - [j94]Scott Davidson:
Bad Design Inside of You. IEEE Des. Test 38(5): 136 (2021) - [j93]Scott Davidson:
Computing in the Real World. IEEE Des. Test 38(6): 100 (2021) - 2020
- [j92]Scott Davidson:
The Last Byte: Big Data, Big Faults. IEEE Des. Test 37(1): 104 (2020) - [j91]Scott Davidson:
The Last Byte: Are You Sure You Love That Store? IEEE Des. Test 37(2): 128 (2020) - [j90]Scott Davidson:
The Last Byte: 3-D TV? We Got 6-D TV! IEEE Des. Test 37(3): 128 (2020) - [j89]Scott Davidson:
My Friendly Orange Glow. IEEE Des. Test 37(4): 112 (2020) - [j88]Scott Davidson:
Transitional Phones. IEEE Des. Test 37(5): 96 (2020) - [j87]Scott Davidson:
Too Many Cooks Make the Product. IEEE Des. Test 37(6): 104 (2020)
2010 – 2019
- 2019
- [j86]Scott Davidson:
Is This a System? IEEE Des. Test 36(1): 72 (2019) - [j85]Scott Davidson:
The Last Byte: I Have Met the IoT Security Enemy and He Is Us. IEEE Des. Test 36(2): 104 (2019) - [j84]Scott Davidson:
The Last Byte: System Testing Ourselves. IEEE Des. Test 36(3): 128 (2019) - [j83]Scott Davidson:
The Last Byte: IoT and That Nagging Feeling. IEEE Des. Test 36(4): 64 (2019) - [j82]Scott Davidson:
The Last Byte: The Internet of People. IEEE Des. Test 36(5): 64 (2019) - 2018
- [j81]Scott Davidson:
Technobabble. IEEE Des. Test 35(1): 104 (2018) - [j80]Scott Davidson:
The Last Byte: Real Time, Real People. IEEE Des. Test 35(2): 109 (2018) - [j79]Scott Davidson:
Electronic Design Automation for IC Implementation, Circuit Design, and Process Technology and Electronic Design Automation for IC System Design, Verification, and Testing. IEEE Des. Test 35(3): 98-99 (2018) - [j78]Scott Davidson:
Computers with Tailfins? IEEE Des. Test 35(3): 104 (2018) - [j77]Scott Davidson:
The Joy of Scheduling. IEEE Des. Test 35(4): 80 (2018) - [j76]Scott Davidson:
Self-Test and Self-Aware. IEEE Des. Test 35(5): 80 (2018) - [j75]Scott Davidson:
Running on Empty. IEEE Des. Test 35(6): 100 (2018) - 2017
- [j74]Scott Davidson:
Research Is Its Own Reward. IEEE Des. Test 34(1): 120 (2017) - [j73]Scott Davidson:
Dark Silicon, Antiparallelism, and Too Much Work. IEEE Des. Test 34(2): 104 (2017) - [j72]Scott Davidson:
Cyber-Physical System Design With Sensor Networking Technologies. IEEE Des. Test 34(3): 105-107 (2017) - [j71]Scott Davidson:
Being Connected. IEEE Des. Test 34(3): 112 (2017) - [j70]Scott Davidson:
Practice Makes Perfect. IEEE Des. Test 34(4): 80 (2017) - [j69]Scott Davidson:
Engineering Secure Internet of Things Systems. IEEE Des. Test 34(5): 97-98 (2017) - [j68]Scott Davidson:
To Verification Infinity and Beyond. IEEE Des. Test 34(5): 104 (2017) - [j67]Scott Davidson:
Chips Thinking About Chips. IEEE Des. Test 34(6): 128 (2017) - 2016
- [j66]Scott Davidson:
Good Enough Computing. IEEE Des. Test 33(1): 96 (2016) - [j65]Scott Davidson:
The Five Stages of Project Grief. IEEE Des. Test 33(2): 104 (2016) - [j64]Scott Davidson:
And He Built a Crooked Chip. IEEE Des. Test 33(3): 144 (2016) - [j63]Scott Davidson:
The Intestinal Superhighway. IEEE Des. Test 33(4): 128 (2016) - [j62]Scott Davidson:
Where Are We Going? IEEE Des. Test 33(5): 104 (2016) - 2015
- [j61]Scott Davidson:
Getting Credit. IEEE Des. Test 32(2): 56 (2015) - [j60]Scott Davidson:
Time Out of Mind. IEEE Des. Test 32(3): 56 (2015) - [j59]Scott Davidson:
A 3-D Forward into the Past. IEEE Des. Test 32(4): 88 (2015) - [j58]Scott Davidson:
Chips That Do Things. IEEE Des. Test 32(6): 112 (2015) - 2014
- [j57]Scott Davidson:
50 Years of DAC Moments. IEEE Des. Test 31(2): 71-72 (2014) - [j56]Scott Davidson:
Hey, you, get onna my cloud [The Last Byte]. IEEE Des. Test 31(3): 95-96 (2014) - [j55]Scott Davidson:
A Truly Wireless Future? IEEE Des. Test 31(6): 56 (2014) - 2013
- [j54]Scott Davidson:
Planned Unobsolescence. IEEE Des. Test 30(6): 104 (2013) - 2012
- [j53]Scott Davidson:
Yield of Black Swans. IEEE Des. Test Comput. 29(1): 80 (2012) - [j52]Scott Davidson:
A World Without Standards. IEEE Des. Test Comput. 29(2): 112 (2012) - [j51]Scott Davidson:
At the beginning. IEEE Des. Test Comput. 29(3): 51 (2012) - [j50]Scott Davidson:
Energy Efficiency Like Your Momma Used to Make. IEEE Des. Test Comput. 29(4): 61 (2012) - [c26]Scott Davidson:
Testing high-frequency and low-power designs: Do the standard rules and tools apply? ITC 2012: 1 - 2011
- [j49]Scott Davidson:
All About Liquid Scan Chains - and More [review of "Digital Microfluidic Biochips: Design Automation and Optimization" (Chakrabarty, K. and Xu, T.; 2010)]. IEEE Des. Test Comput. 28(3): 80-81 (2011) - [c25]Liang-Chi Chen, Peter Dahlgren, Paul Dickinson, Scott Davidson:
Transition test bring-up and diagnosis on UltraSPARCTM processors. ITC 2011: 1-10 - 2010
- [j48]Scott Davidson:
Concurrent checking for logic [review of "New Methods of Concurrent Checking (Goessel, M., et al; 2008)]. IEEE Des. Test Comput. 27(3): 80-81 (2010) - [j47]Scott Davidson:
About the power problem [review of "Power-Aware Testing and Test Strategies for Low Power Devices" (Girard, P., Eds., et.; 2010)]. IEEE Des. Test Comput. 27(6): 72-73 (2010)
2000 – 2009
- 2009
- [j46]Scott Davidson:
A second course on testing [review of System on Chip Test Architectures (Wang, L.-T et al., Eds.; 2007)]. IEEE Des. Test Comput. 26(1): 98-101 (2009) - [j45]Scott Davidson:
Book Review: A book on system test, and testing systems also. IEEE Des. Test Comput. 26(3): 92-93 (2009) - [j44]Scott Davidson:
Book Reviews: A guide for the wrapper perplexed. IEEE Des. Test Comput. 26(6): 98-99 (2009) - [j43]Scott Davidson:
The Last Byte: Too many reboots. IEEE Des. Test Comput. 26(6): 104 (2009) - [c24]Liang-Chi Chen, Paul Dickinson, Peter Dahlgren, Scott Davidson, Olivier Caty, Kevin Wu:
Using transition test to understand timing behavior of logic circuits on UltraSPARCTM T2 family. ITC 2009: 1-10 - 2008
- [j42]Scott Davidson:
How to make your own processor architecture. IEEE Des. Test Comput. 25(1): 96-98 (2008) - [j41]Scott Davidson, Nur A. Touba:
Guest Editors' Introduction: Progress in Test Compression. IEEE Des. Test Comput. 25(2): 112-113 (2008) - [j40]Scott Davidson:
The commonality of vector generation techniques. IEEE Des. Test Comput. 25(2): 200 (2008) - [j39]Scott Davidson:
With pick and shovel through our data. IEEE Des. Test Comput. 25(4): 382-383 (2008) - [c23]Scott Davidson:
Justifying DFT with a Hierarchical Top-Down Cost-Benefit Model. ITC 2008: 1-10 - 2007
- [j38]Scott Davidson:
A laboratory right under your nose. IEEE Des. Test Comput. 24(1): 104 (2007) - [j37]Scott Davidson:
A textbook with two target audiences. IEEE Des. Test Comput. 24(2): 198-199 (2007) - [j36]Scott Davidson:
Losing control. IEEE Des. Test Comput. 24(2): 208 (2007) - [j35]Scott Davidson:
How do we train today's students to become tomorrow's engineers? IEEE Des. Test Comput. 24(4): 408 (2007) - [j34]Scott Davidson, Helen Davidson:
The Psychology of Electronic Test. IEEE Des. Test Comput. 24(5): 494-501 (2007) - [j33]Scott Davidson:
Book Reviews: Test Tutorials in Book Form. IEEE Des. Test Comput. 24(5): 506-507 (2007) - 2006
- [j32]Scott Davidson:
Searching for clues: Diagnosing IC failures. IEEE Des. Test Comput. 23(1): 67-68 (2006) - [j31]Scott Davidson:
All about getting it. IEEE Des. Test Comput. 23(1): 80 (2006) - [j30]Scott Davidson:
An insider's look at microprocessor design. IEEE Des. Test Comput. 23(2): 162-163 (2006) - [j29]Scott Davidson:
Who Reads This Stuff Anyway? IEEE Des. Test Comput. 23(4): 328 (2006) - [j28]Scott Davidson:
Book Reviews: A Comprehensive EDA Handbook. IEEE Des. Test Comput. 23(5): 426-427 (2006) - [c22]Scott Davidson, Anthony P. Ambler, Helen Davidson:
Behavioral Test Economics. ITC 2006: 1-9 - [e1]Scott Davidson, Anne Gattiker:
2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. IEEE Computer Society 2006, ISBN 1-4244-0292-1 [contents] - 2005
- [j27]Scott Davidson:
Testing: It's not just pass/fail anymore. IEEE Des. Test Comput. 22(1): 80 (2005) - [j26]Scott Davidson:
BIST the hard way. IEEE Des. Test Comput. 22(4): 386-387 (2005) - [j25]Scott Davidson:
What's the problem? IEEE Des. Test Comput. 22(4): 392 (2005) - [j24]Scott Davidson:
Guest Editor's Introduction: ITC Examines How Test Helps the Fittest Survive. IEEE Des. Test Comput. 22(6): 565 (2005) - [c21]Scott Davidson:
The ITC test compression shootout. ITC 2005: 1 - [c20]Scott Davidson:
Understanding NTF components from the field. ITC 2005: 10 - [c19]Scott Davidson:
Towards an Understanding of No Trouble Found Devices. VTS 2005: 147-152 - 2004
- [j23]Scott Davidson:
Paperless Design and Test. IEEE Des. Test Comput. 21(1): 72- (2004) - [j22]Scott Davidson:
A practical look at ATPG. IEEE Des. Test Comput. 21(5): 448-449 (2004) - [j21]Scott Davidson:
Open-source hardware. IEEE Des. Test Comput. 21(5): 456- (2004) - [j20]Scott Davidson:
Design illiteracy. IEEE Des. Test Comput. 21(6): 608 (2004) - 2003
- [j19]Scott Davidson:
All I Know I Learned at ITC. IEEE Des. Test Comput. 20(5): 104- (2003) - [c18]Michael G. Wahl, Sudipta Bhawmik, Kamran Zarrineh, Pradipta Ghosh, Scott Davidson, Peter Harrod:
The P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data. ITC 2003: 998-1007 - 2002
- [c17]Ramesh C. Tekumalla, Scott Davidson:
On Identifying Indistinguishable Path Delay Faults and Improving Diagnosis. ITC 2002: 993-1002 - [c16]Scott Davidson:
What Can IC Test Teach System Test? ITC 2002: 1187 - 2001
- [j18]Scott Davidson:
Welcome to 2001. IEEE Des. Test Comput. 18(2): 112- (2001) - [c15]Magdy S. Abadir, Scott Davidson, Vijay Nagasamy, Dhiraj K. Pradhan, Prab Varma:
ATPG for Design Errors-Is It Possible? VTS 2001: 283-285 - [c14]Chao-Wen Tseng, Subhasish Mitra, Edward J. McCluskey, Scott Davidson:
An Evaluation of Pseudo Random Testing for Detecting Real Defects. VTS 2001: 404-410 - 2000
- [j17]Scott Davidson:
Twenty Years Ago Today. IEEE Des. Test Comput. 17(1): 111-112 (2000) - [j16]Scott Davidson, Justin E. Harlow III:
Guest Editors' Introduction: Benchmarking for Design and Test. IEEE Des. Test Comput. 17(3): 12-14 (2000) - [j15]Scott Davidson:
Testing in 2100. IEEE Des. Test Comput. 17(4): 119-120 (2000)
1990 – 1999
- 1999
- [j14]Scott Davidson:
How Do I Boot Thee? Let Me Check Page 3. IEEE Des. Test Comput. 16(2): 96- (1999) - [c13]Scott Davidson:
Changing our Path to High Level ATPG. ITC 1999: 1114 - [c12]Scott Davidson:
ITC'99 Benchmark Circuits - Preliminary Results. ITC 1999: 1125 - 1998
- [j13]Scott Davidson:
The Newer Colossus. IEEE Des. Test Comput. 15(2): 96- (1998) - [j12]Scott Davidson:
Minutes Found on a Cave Wall. IEEE Des. Test Comput. 15(3): 128- (1998) - [j11]Scott Davidson:
The Last Byte. IEEE Des. Test Comput. 15(4): 96- (1998) - [c11]Scott Davidson:
ASIC jeopardy-diagnosing without a FAB. ITC 1998: 1136 - [c10]José M. Miranda, Scott Davidson, Peter Dziel, Saman Adham, Steve Millman:
Test Reuse at System Level. VTS 1998: 318-319 - 1997
- [j10]Scott Davidson:
George learns test. IEEE Des. Test Comput. 14(1): 96- (1997) - [j9]Scott Davidson:
Why projects are late. IEEE Des. Test Comput. 14(2): 96- (1997) - 1996
- [j8]Scott Davidson:
Base 1 logic: A method for environmentally friendly PC design. IEEE Des. Test Comput. 13(1): 88- (1996) - [j7]Scott Davidson:
A test puzzle for a TGIF morning. IEEE Des. Test Comput. 13(2): 96- (1996) - [j6]Scott Davidson:
How to achieve 95% fault coverage without really trying. IEEE Des. Test Comput. 13(3): 120- (1996) - 1994
- [c9]Scott Davidson:
Is IDDQ Yield Loss Inevitable? ITC 1994: 572-579 - [c8]Suntae Hwang, Rochit Rajsuman, Scott Davidson:
IDDQ Detection of CMOS Bridging Faults by Stuck-At Fault Tests. VLSI Design 1994: 183-186
1980 – 1989
- 1989
- [j5]Scott Davidson:
Guest Editor's Introduction: Software Tools for Hardware Tests. Computer 22(4): 12-14 (1989) - 1986
- [j4]Scott Davidson:
Progress im High-Level Microprogramming. IEEE Softw. 3(4): 18-26 (1986) - [c7]Scott Davidson, James L. Lewandowski:
ESIM/AFS : A Concurrent Architectural Level Fault Simulator. ITC 1986: 375-385 - 1985
- [c6]Scott Davidson:
High level design automation tools (session overview). ACM Conference on Computer Science 1985: 73 - 1984
- [c5]Scott Davidson:
Fault Simulation at the Architectural Level. ITC 1984: 669-679 - 1981
- [j3]Scott Davidson, David Landskov, Bruce D. Shriver, Patrick W. Mallett:
Some Experiments in Local Microcode Compaction for Horizontal Machines. IEEE Trans. Computers 30(7): 460-477 (1981) - [c4]Scott Davidson, Bruce D. Shriver:
Specifying target resources in a machine independent higher level language. AFIPS National Computer Conference 1981: 81-85 - 1980
- [j2]David Landskov, Scott Davidson, Bruce D. Shriver, Patrick W. Mallett:
Local Microcode Compaction Techniques. ACM Comput. Surv. 12(3): 261-294 (1980) - [c3]Bruce D. Shriver, Scott Davidson:
Firmware Engineering - Firmware Engineering. Firmware Engineering 1980: 25-71
1970 – 1979
- 1978
- [j1]Scott Davidson, Bruce D. Shriver:
An Overview of Firmware Engineering. Computer 11(5): 21-33 (1978) - 1976
- [c2]Scott Davidson, William Tao:
Testing of microprograms using the lockheed SUE microinstruction simulator. ANSS 1976: 189-196 - 1975
- [c1]Scott Davidson:
A network of dynamically microprogrammable machines. MICRO (1) 1975: 1-5
Coauthor Index
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last updated on 2024-04-25 02:44 CEST by the dblp team
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