- Wei Han, Ying Yi, Mark Muir, Ioannis Nousias, Tughrul Arslan, Ahmet T. Erdogan:
Multicore Architectures With Dynamically Reconfigurable Array Processors for Wireless Broadband Technologies. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(12): 1830-1843 (2009) - Davit Harutyunyan, Joost Rommes, E. Jan W. ter Maten, Wil H. A. Schilders:
Simulation of Mutually Coupled Oscillators Using Nonlinear Phase Macromodels. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(10): 1456-1466 (2009) - Zyad Hassan, Nicholas Allec, Li Shang, Robert P. Dick, V. Venkatraman, Ronggui Yang:
Multiscale Thermal Analysis for Nanometer-Scale Integrated Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(6): 860-873 (2009) - Khaled R. Heloue, Navid Azizi, Farid N. Najm:
Full-Chip Model for Leakage-Current Estimation Considering Within-Die Correlation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(6): 874-887 (2009) - Yu Hu, Satyaki Das, Steven Trimberger, Lei He:
Design and Synthesis of Programmable Logic Block With Mixed LUT and Macrogate. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(4): 591-595 (2009) - Shiyan Hu, Mahesh Ketkar, Jiang Hu:
Gate Sizing for Cell-Library-Based Designs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(6): 818-825 (2009) - Shih-Hsu Huang, Chun-Hua Cheng:
Minimum-Period Register Binding. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(8): 1265-1269 (2009) - Urban Ingelsson, Bashir M. Al-Hashimi, S. Saqib Khursheed, Sudhakar M. Reddy, Peter Harrod:
Process Variation-Aware Test for Resistive Bridges. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(8): 1269-1274 (2009) - Zhigang Jiang, Sandeep K. Gupta:
Threshold Testing: Improving Yield for Nanoscale VLSI. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(12): 1883-1895 (2009) - Tai-Ying Jiang, Chien-Nan Jimmy Liu, Jing-Yang Jou:
Accurate Rank Ordering of Error Candidates for Efficient HDL Design Debugging. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(2): 272-284 (2009) - Minje Jun, Sungjoo Yoo, Eui-Young Chung:
Topology Synthesis of Cascaded Crossbar Switches. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(6): 926-930 (2009) - S. Saqib Khursheed, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Peter Harrod:
Diagnosis of Multiple-Voltage Design With Bridge Defect. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(3): 406-416 (2009) - Myeongjin Kim, Eui-Young Chung, Sungroh Yoon:
High-Speed Post-Layout Logic Simulation Using Quasi-Static Clock Event Evaluation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(8): 1274-1278 (2009) - Jungsoo Kim, Seungyong Oh, Sungjoo Yoo, Chong-Min Kyung:
An Analytical Dynamic Scaling of Supply Voltage and Body Bias Based on Parallelism-Aware Workload and Runtime Distribution. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(4): 568-581 (2009) - Ho Fai Ko, Nicola Nicolici:
Algorithms for State Restoration and Trace-Signal Selection for Data Acquisition in Silicon Debug. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(2): 285-297 (2009) - Smita Krishnaswamy, Stephen Plaza, Igor L. Markov, John P. Hayes:
Signature-Based SER Analysis and Design of Logic Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(1): 74-86 (2009) - Yu-Min Kuo, Yue-Lung Chang, Shih-Chieh Chang:
Efficient Boolean Characteristic Function for Timed Automatic Test Pattern Generation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(3): 417-425 (2009) - Yu-Min Kuo, Ya-Ting Chang, Shih-Chieh Chang, Malgorzata Marek-Sadowska:
Spare Cells With Constant Insertion for Engineering Change. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(3): 456-460 (2009) - Wan Yeon Lee, Hyogon Kim, Heejo Lee:
Maximum-Utility Scheduling of Operation Modes With Probabilistic Task Execution Times Under Energy Constraints. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(10): 1531-1544 (2009) - Wan-Ping Lee, Hung-Yi Liu, Yao-Wen Chang:
Voltage-Island Partitioning and Floorplanning Under Timing Constraints. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(5): 690-702 (2009) - Cheng-Hong Li, Luca P. Carloni:
Leveraging Local Intracore Information to Increase Global Performance in Block-Based Design of Systems-on-Chip. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(2): 165-178 (2009) - Jing Li, Kunhyuk Kang, Kaushik Roy:
Variation Estimation and Compensation Technique in Scaled LTPS TFT Circuits for Low-Power Low-Cost Applications. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(1): 46-59 (2009) - Mark Po-Hung Lin, Yao-Wen Chang, Shyh-Chang Lin:
Analog Placement Based on Symmetry-Island Formulation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(6): 791-804 (2009) - Chen-Hsuan Lin, Chun-Yao Wang, Yung-Chih Chen:
Dependent-Latch Identification in Reachable State Space. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(8): 1113-1126 (2009) - Shenghua Liu, Guoqiang Chen, Tom Tong Jing, Lei He, Tianpei Zhang, Robi Dutta, Xianlong Hong:
Substrate Topological Routing for High-Density Packages. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(2): 207-216 (2009) - Qiang Liu, George A. Constantinides, Konstantinos Masselos, Peter Y. K. Cheung:
Combining Data Reuse With Data-Level Parallelization for FPGA-Targeted Hardware Compilation: A Geometric Programming Framework. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(3): 305-315 (2009) - Qunzeng Liu, Sachin S. Sapatnekar:
A Framework for Scalable Postsilicon Statistical Delay Prediction Under Process Variations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(8): 1201-1212 (2009) - Enrico Macii:
Editorial. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(12): 1785 (2009) - Paolo Maffezzoni, Dario D'Amore:
Evaluating Pulling Effects in Oscillators Due to Small-Signal Injection. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(1): 22-31 (2009) - Radu Marculescu, Ümit Y. Ogras, Li-Shiuan Peh, Natalie D. Enright Jerger, Yatin Vasant Hoskote:
Outstanding Research Problems in NoC Design: System, Microarchitecture, and Circuit Perspectives. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(1): 3-21 (2009)