Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Threshold Testing: Improving Yield for Nanoscale VLSI."

Zhigang Jiang, Sandeep K. Gupta (2009)

> Home

Details and statistics

DOI: 10.1109/TCAD.2009.2032375

access: closed

type: Journal Article

metadata version: 2023-09-21

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcad/JiangG09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcad/JiangG09
Zhigang Jiang, Sandeep K. Gupta:
Threshold Testing: Improving Yield for Nanoscale VLSI. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(12): 1883-1895 (2009)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.