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ORCIDMagali Estrada
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- affiliation: CINVESTAV-IPN, Mexico
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Journal Articles
- 2017
[j21]Isaí Hernández, César Adrián Pons-Flores
, Ivan Garduño, Julio C. Tinoco, Israel Mejia, Magali Estrada:
Characterization of MIS structures and thin film transistors using RF-sputtered HfO2/HIZO layers. Microelectron. Reliab. 75: 9-13 (2017)- 2016
- [j20]Magali Estrada, M. Rivas, Ivan Garduño, F. Avila-Herrera, Antonio Cerdeira, Marcelo Antonio Pavanello, Israel Mejia, M. A. Quevedo-Lopez:
Temperature dependence of the electrical characteristics up to 370 K of amorphous In-Ga-ZnO thin film transistors. Microelectron. Reliab. 56: 29-33 (2016) - [j19]Antonio Cerdeira, Magali Estrada, Lluís F. Marsal, Josep Pallarès, Benjamín Iñíguez:
On the series resistance in staggered amorphous thin film transistors. Microelectron. Reliab. 63: 325-335 (2016) - 2014
- [j18]C. Meneses, J. G. Sánchez, Magali Estrada, Antonio Cerdeira, Josep Pallarès, Benjamín Iñíguez, Lluís F. Marsal:
Characterization of MIS structures and PTFTs using TiOx deposited by spin-coating. Microelectron. Reliab. 54(5): 893-898 (2014) - 2013
- [j17]V. S. Balderrama, Magali Estrada, Aurelien Viterisi, Pilar Formentin, Josep Pallarès, Josep Ferré-Borrull, Emilio Palomares, Lluís F. Marsal:
Correlation between P3HT inter-chain structure and Jsc of P3HT: PC[70]BM blends for solar cells. Microelectron. Reliab. 53(4): 560-564 (2013) - 2012
- [j16]Alejandra Castro-Carranza, Magali Estrada, Jairo C. Nolasco, Antonio Cerdeira, Lluís F. Marsal, Benjamín Iñíguez, Josep Pallarès:
Organic thin-film transistor bias-dependent capacitance compact model in accumulation regime. IET Circuits Devices Syst. 6(2): 130-135 (2012) - [j15]Rodrigo Picos, Eugenio García-Moreno, Miquel Roca, Benjamín Iñíguez, Magali Estrada, Antonio Cerdeira:
Optimised design of an organic thin-film transistor amplifier using the gm/ID methodology. IET Circuits Devices Syst. 6(2): 136-140 (2012) - [j14]Magali Estrada, Antonio Cerdeira, Benjamín Iñíguez:
Effect of interface charge on the dc bias stress-induced deformation and shift of the transfer characteristic of amorphous oxide thin-film transistors. Microelectron. Reliab. 52(7): 1342-1345 (2012) - [j13]Antonio Cerdeira, Magali Estrada, Blanca S. Soto-Cruz, Benjamín Iñíguez:
Modeling the behavior of amorphous oxide thin film transistors before and after bias stress. Microelectron. Reliab. 52(11): 2532-2536 (2012) - 2011
- [j12]V. S. Balderrama, Magali Estrada, Antonio Cerdeira, Blanca S. Soto-Cruz, Lluís F. Marsal, Josep Pallarès, Jairo C. Nolasco, Benjamín Iñíguez, Emilio Palomares, Josep Albero:
Influence of P3HT: PCBM blend preparation on the active layer morphology and cell degradation. Microelectron. Reliab. 51(3): 597-601 (2011) - 2009
- [j11]J. C. Sánchez, Magali Estrada:
Stability of the J-V characteristics of (BEHP-PPV)-co-(MEH-PPV) based light-emitting diodes. Microelectron. Reliab. 49(12): 1503-1507 (2009) - 2008
- [j10]Julio C. Tinoco, Magali Estrada, Benjamín Iñíguez, Antonio Cerdeira:
Conduction mechanisms of silicon oxide/titanium oxide MOS stack structures. Microelectron. Reliab. 48(3): 370-381 (2008) - [j9]Israel Mejia, Magali Estrada, M. Avila:
Improved upper contacts PMMA on P3HT PTFTS using photolithographic processes. Microelectron. Reliab. 48(11-12): 1795-1799 (2008) - 2005
- [j8]Magali Estrada, Antonio Cerdeira, Luis Reséndiz, Benjamín Iñíguez, Lluís F. Marsal, Josep Pallarès:
Effect of localized traps on the anomalous behavior of the transconductance in nanocrystalline TFTs. Microelectron. Reliab. 45(7-8): 1161-1166 (2005) - 2004
- [j7]Juan Santana, Magali Estrada, Ofelia Martinez:
Editorial. Microelectron. Reliab. 44(4): 649 (2004) - [j6]V. Sánchez, J. Munguía, Magali Estrada:
Photo-CVD process for ultra thin SiO2 films. Microelectron. Reliab. 44(5): 885-888 (2004) - 2003
- [j5]Magali Estrada, A. Afzalian, Denis Flandre, Antonio Cerdeira, Héctor Báez-Medina, A. de Lucca:
FD MOS SOI circuit to enhance the ratio of illuminated to dark current of a co-integrated a-Si: H photodiode. Microelectron. Reliab. 43(2): 189-193 (2003) - [j4]Julio C. Tinoco, Magali Estrada, G. Romero:
Room temperature plasma oxidation mechanism to obtain ultrathin silicon oxide and titanium oxide layers. Microelectron. Reliab. 43(6): 895-903 (2003) - [j3]Rodolfo Zolá García-Lozano, Magali Estrada, Antonio Cerdeira:
Effects of impurity concentration, hydrogen plasma process and crystallization temperature on poly-crystalline films obtained from PECVD a-Si: H layers. Microelectron. Reliab. 43(8): 1281-1287 (2003) - 2002
- [j2]Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juin J. Liou, Antonio Cerdeira, Magali Estrada, Y. Yue:
A review of recent MOSFET threshold voltage extraction methods. Microelectron. Reliab. 42(4-5): 583-596 (2002) - 2001
- [j1]Magali Estrada, Antonio Cerdeira, Adelmo Ortiz-Conde, Francisco J. García-Sánchez:
Determination of trap cross-section in a-Si: H p-i-n diodes parameters using simulation and parameter extraction. Microelectron. Reliab. 41(4): 605-610 (2001)
Conference and Workshop Papers
- 2016
- [c8]Y. Hernandez-Barrios, F. Avila-Herrera, Magali Estrada, Antonio Cerdeira, Oana Moldovan, Benjamín Iñíguez, Rodrigo Picos:
Modeling the variation of threshold voltage, mobility factor and saturation coefficient in amorphous Indium-Gallium-Zinc Oxide thin film transistors. CCE 2016: 1-4 - [c7]Magaly Ramirez-Como, Victor Samuel Balderrama, Magali Estrada:
Performance parameters degradation of inverted organic solar cells exposed under solar and artificial irradiance, using PTB7: PC70BM as active layer. CCE 2016: 1-5 - 2014
- [c6]Mónica Vuelvas Trinidad, Luis M. Reséndiz-Mendoza, Víctor Cabrera-Arenas, Magali Estrada:
Polyfluorene-based light-emitting diodes using TiOx as an electron injection layer. CCE 2014: 1-3 - 2012
- [c5]L. Fernando Ulloa, Magali Estrada, José G. Sanchez, V. M. Flores, Luis Reséndiz:
Preparation, deposition and characterization of PTFTs based on PCDTBT/PMMA. CCE 2012: 1-4 - 2011
- [c4]V. S. Balderrama, Magali Estrada, Pilar Formentin, Aurelien Viterisi, Josep Ferré-Borrull, Josep Pallarès, Emilio Palomares, Lluís F. Marsal:
Influence and relationship of film morphology on Organic Solar Cells manufactured with different P3HT: PC[70]BM blend solutions. CCE 2011: 1-5 - [c3]Antonio Cerdeira, Magali Estrada, Benjamín Iñíguez, S. Soto:
Modeling the subthreshold region of OTFTs. CCE 2011: 1-4 - [c2]Salvador Ivan Garduño, Antonio Cerdeira, Magali Estrada:
Gate leakage currents modeling for oxynitride gate dielectric in double gate MOSFETs. CCE 2011: 1-5 - [c1]José G. Sanchez, V. M. Flores, Luis Reséndiz, Magali Estrada:
Preparation, deposition and characterization of TiOx layers for organic PLEDs, solar cells and PTFTs. CCE 2011: 1-4
Coauthor Index
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