"Temperature dependence of the electrical characteristics up to 370 K of ..."

Magali Estrada et al. (2016)

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DOI: 10.1016/J.MICROREL.2015.10.015

access: closed

type: Journal Article

metadata version: 2021-05-10

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Magali Estrada, M. Rivas, Ivan Garduño, F. Avila-Herrera, Antonio Cerdeira, Marcelo Antonio Pavanello, Israel Mejia, M. A. Quevedo-Lopez:
Temperature dependence of the electrical characteristics up to 370 K of amorphous In-Ga-ZnO thin film transistors. Microelectron. Reliab. 56: 29-33 (2016)

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