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2020 – today
- 2023
[j6]Josep Altet
, Xavier Aragonès, Enrique Barajas, Xavier Gisbert, Sergio Martínez, Diego Mateo:
Aging Compensation in a Class-A High-Frequency Amplifier with DC Temperature Measurements. Sensors 23(16): 7069 (2023)- 2022
- [j5]Sergio Vélez, Florian Rançon, Enrique Barajas, Guilhem Brunel, José Antonio Rubio, Bruno Tisseyre:
Potential of functional analysis applied to Sentinel-2 time-series to assess relevant agronomic parameters at the within-field level in viticulture. Comput. Electron. Agric. 194: 106726 (2022) - 2021
- [j4]Josep Altet, Enrique Barajas, Diego Mateo, Alexandre Billong, Xavier Aragonès, Xavier Perpiñà, Ferran Reverter:
BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits. Sensors 21(3): 805 (2021) - 2020
- [c10]Rosana Rodríguez, Albert Crespo-Yepes, Javier Martín-Martínez, Montserrat Nafría, Xavier Aragonès, Diego Mateo, Enrique Barajas:
Experimental Monitoring of Aging in CMOS RF Linear Power Amplifiers: Correlation Between Device and Circuit Degradation. IRPS 2020: 1-7
2010 – 2019
- 2019
- [j3]Javier Diaz-Fortuny, Javier Martín-Martínez, Rosana Rodríguez, Rafael Castro-López, Elisenda Roca, Xavier Aragonès, Enrique Barajas, Diego Mateo, Francisco V. Fernández, Montserrat Nafría:
A Versatile CMOS Transistor Array IC for the Statistical Characterization of Time-Zero Variability, RTN, BTI, and HCI. IEEE J. Solid State Circuits 54(2): 476-488 (2019) - [j2]Enrique Barajas, Xavier Aragonès, Diego Mateo, Josep Altet:
Differential Temperature Sensors: Review of Applications in the Test and Characterization of Circuits, Usage and Design Methodology. Sensors 19(21): 4815 (2019) - [j1]Xavier Perpiñà, Ferran Reverter, Javier Leon, Enrique Barajas, Miquel Vellvehí, Xavier Jordà, Josep Altet:
Output Power and Gain Monitoring in RF CMOS Class A Power Amplifiers by Thermal Imaging. IEEE Trans. Instrum. Meas. 68(8): 2861-2870 (2019) - [c9]Anant Rungta, Josep Altet, Enrique Barajas, Antonio Rubio, Xavier Aragonès, Diego Mateo:
On the Use of Built-In Temperature Sensors to Monitor Aging in RF Circuits. DCIS 2019: 1-6 - [c8]Xavier Aragonès, Diego Mateo, Enrique Barajas, Albert Crespo-Yepes, Rosana Rodríguez, Javier Martín-Martínez, Montserrat Nafría:
Aging in CMOS RF Linear Power Amplifiers: Experimental Comparison and Modeling. ISCAS 2019: 1-5 - 2018
- [c7]Enrique Barajas, Xavier Aragonès, Diego Mateo, Francesc Moll, Antonio Rubio, Javier Martín-Martínez, Rosana Rodríguez, Marc Porti, Montserrat Nafría, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández:
Analysis of Body Bias and RTN-Induced Frequency Shift of Low Voltage Ring Oscillators in FDSOI Technology. PATMOS 2018: 82-87 - 2017
- [c6]Javier Diaz-Fortuny, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Enrique Barajas, Xavier Aragonès, Diego Mateo:
A transistor array chip for the statistical characterization of process variability, RTN and BTI/CHC aging. SMACD 2017: 1-4 - 2014
- [c5]Peyman Pouyan, Esteve Amat, Enrique Barajas, Antonio Rubio:
Impact of adaptive proactive reconfiguration technique on Vmin and lifetime of SRAM caches. ISQED 2014: 32-38 - 2010
- [c4]Enrique Barajas, Diego Mateo, José Luis González:
Behavioural Modelling of DLLs for Fast Simulation and Optimisation of Jitter and Power Consumption. DSD 2010: 541-547
2000 – 2009
- 2007
- [c3]Enrique Barajas, R. Cosculluela, D. Coutinho, Diego Mateo, José Luis González, I. Cairò, S. Banda, M. Ikeda:
Interactive presentation: Behavioral modeling of delay-locked loops and its application to jitter optimization in ultra wide-band impulse radio systems. DATE 2007: 1430-1435 - 2005
- [c2]Tomás Lahoz, Enrique Barajas, José Luis González:
Characterization and noise analysis of a 12-bit current steering digital-to-analog converter. ISCAS (1) 2005: 204-207 - [c1]Enrique Barajas, Luis Elvira, Miguel A. Méndez, Ferran Martorell, Diego Mateo, José Luis González:
Discrete and continuous substrate noise spectrum dependence on digital circuit characteristics. ISCAS (5) 2005: 4273-4276
Coauthor Index
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