default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDIEEE Design & Test, Volume 34
Volume 34, Number 1, February 2017
- Jörg Henkel:
3D Test. 4-5 - Erik Jan Marinissen
, Yervant Zorian:
Guest Editors' Introduction: Design & Test of a High-Volume 3-D Stacked Graphics Processor With High-Bandwidth Memory. 6-7 - Michael Alfano, Bryan Black, Jeff Rearick, Joseph Siegel, Michael Su, Julius Din:
Unleashing Fury: A New Paradigm for 3-D Design and Test. 8-15 - Hongshin Jun, Sang Kyun Nam, Han Ho Jin, Jong-Chern Lee, Yong Jae Park, Jaejin Lee:
High-Bandwidth Memory (HBM) Test Challenges and Solutions. 16-25 - Marc Loranger, Onnik Yaglioglu, John Oonk:
High-Performance HBM Known-Good-Stack Testing. 26-34 - Panu Jalas, Timo Rahkonen:
Estimating the Impact of Methodology on Analog Integrated Circuit Design Time. 35-46 - Selahattin Sayil, Archit H. Shah, Md. Adnan Zaman, Mohammad A. Islam:
Soft Error Mitigation Using Transmission Gate With Varying Gate and Body Bias. 47-56 - Samah Mohamed Saeed, Ozgur Sinanoglu:
A Comprehensive Design-for-Test Infrastructure in the Context of Security-Critical Applications. 57-64 - Wisam Kadry, Dmitry Krestyashyn, Arkadiy Morgenshtein, Amir Nahir, Vitali Sokhin, Jin Sung Park, Sung-Boem Park, Wookyeong Jeong, Jae-Cheol Son:
Test Generation Methods for Utilization Improvement of Hardware-Accelerated Simulation Platforms. 65-76 - Andy D. Pimentel:
Exploring Exploration: A Tutorial Introduction to Embedded Systems Design Space Exploration. 77-90 - Mark Papermaster:
Developing Great Products for the Immersive Computing Era. 91-94 - Magdy Abadir:
An Interview With Semiconductor Pioneer and EDA Visionary Leader Wally Rhines. 95-105 - Lothar Thiele, Jörg Henkel:
Report of the 2016 Embedded Systems Week (ESWEEK). 106-107 - Theo Theocharides:
Test Technology TC Newsletter. 115-117 - Scott Davidson:
Research Is Its Own Reward. 120
Volume 34, Number 2, April 2017
- Jörg Henkel:
Power Density. 4 - Muhammad Shafique, Siddharth Garg, Vikas Chandra:
Guest Editors' Introduction: Computing in the Dark Silicon Era. 5-7 - Muhammad Shafique, Siddharth Garg:
Computing in the Dark Silicon Era: Current Trends and Research Challenges. 8-23 - Vivek De, Sriram R. Vangal, Ram Krishnamurthy:
Near Threshold Voltage (NTV) Computing: Computing in the Dark Silicon Era. 24-30 - Nathaniel Ross Pinckney, Supreet Jeloka, Ronald G. Dreslinski, Trevor N. Mudge, Dennis Sylvester, David T. Blaauw, Lucian Shifren, Brian Cline, Saurabh Sinha:
Impact of FinFET on Near-Threshold Voltage Scalability. 31-38 - Ardavan Pedram, Stephen Richardson, Mark Horowitz, Sameh Galal, Shahar Kvatinsky:
Dark Memory and Accelerator-Rich System Optimization in the Dark Silicon Era. 39-50 - Mohammad Hashem Haghbayan, Amir M. Rahmani, Pasi Liljeberg, Axel Jantsch, Antonio Miele, Cristiana Bolchini, Hannu Tenhunen:
Can Dark Silicon Be Exploited to Prolong System Lifetime? 51-59 - Amir Yazdanbakhsh, Divya Mahajan, Hadi Esmaeilzadeh, Pejman Lotfi-Kamran:
AxBench: A Multiplatform Benchmark Suite for Approximate Computing. 60-68 - Zhi-Yong Liu, Hsiu-Chuan Shih, Bing-Yang Lin, Cheng-Wen Wu:
Controller Architecture for Low-Power, Low-Latency DRAM With Built-in Cache. 69-78 - Cristiana Bolchini, Luca Cassano:
A Fully Automated and Configurable Cost-Aware Framework for Adaptive Functional Diagnosis. 79-86 - Marilyn Wolf:
The Physics of Event-Driven IoT Systems. 87-90 - Frank Liu:
Highlights of ICCAD 2016. 92-93 - Michael J. Flynn, Subhasish Mitra:
Edward J. McCluskey 1929-2016. 94-98 - Theo Theocharides:
TTTC News. 99-101 - Scott Davidson:
Dark Silicon, Antiparallelism, and Too Much Work. 104
Volume 34, Number 3, June 2017
- Jörg Henkel:
Emerging Memory Technologies. 4-5 - Yiran Chen, Tei-Wei Kuo, Barbara De Salvo:
Guest Editors' Introduction: Critical and Enabling Techniques for Emerging Memories. 6-7 - Yiran Chen, Hai Helen Li, Ismail Bayram, Enes Eken:
Recent Technology Advances of Emerging Memories. 8-22 - Mouhamad Alayan, Elisa Vianello, Barbara De Salvo, Luca Perniola, Andrea Padovani, Luca Larcher:
Correlated Effects on Forming and Retention of Al Doping in HfO2-Based RRAM. 23-30 - Shivam Swami, Kartik Mohanram:
Reliable Nonvolatile Memories: Techniques and Measures. 31-41 - Caiwen Ding, Ning Liu, Yanzhi Wang, Ji Li, Soroush Heidari, Jingtong Hu, Yongpan Liu:
Multisource Indoor Energy Harvesting for Nonvolatile Processors. 42-49 - Kai-Li Wang, Bing-Yang Lin, Cheng-Wen Wu, Mincent Lee, Hao Chen, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang:
Test Cost Reduction Methodology for InFO Wafer-Level Chip-Scale Package. 50-58 - Hussam Amrouch, Victor M. van Santen, Jörg Henkel:
Interdependencies of Degradation Effects and Their Impact on Computing. 59-67 - Prabhat Mishra, Ronny Morad, Avi Ziv, Sandip Ray:
Post-Silicon Validation in the SoC Era: A Tutorial Introduction. 68-92 - Krishnendu Chakrabarty:
Quo Vadis Test? The Past, the Present, and the Future: No Longer a Necessary Evil. 93-95 - David Yeh:
Designing Secure Electronics: Challenges From a Hardware Perspective. 96-102 - Naofumi Takagi:
Recap of the 22nd Asia and South- Pacific Design Automation Conference. 103-104 - Scott Davidson:
Cyber-Physical System Design With Sensor Networking Technologies. 105-107 - José L. Ayala:
Code Ocean Is Live: Upload Your Algorithms. 108-109 - Theo Theocharides:
Test Technology TC Newsletter. 110-111 - Scott Davidson:
Being Connected. 112
Volume 34, Number 4, August 2017
- Jörg Henkel:
Cyber-Physical Systems Security and Privacy. 4 - Michail Maniatakos, Alvaro A. Cárdenas, Ramesh Karri:
Guest Editors' Introduction: Cyber-Physical Systems Security and Privacy. 5-6 - Jairo Giraldo, Esha Sarkar, Alvaro A. Cárdenas, Michail Maniatakos, Murat Kantarcioglu:
Security and Privacy in Cyber-Physical Systems: A Survey of Surveys. 7-17 - Sujit Rokka Chhetri, Mohammad Abdullah Al Faruque:
Side Channels of Cyber-Physical Systems: Case Study in Additive Manufacturing. 18-25 - Sandhya Koteshwara, Amitabh Das:
Comparative Study of Authenticated Encryption Targeting Lightweight IoT Applications. 26-33 - A. P. Sakis Meliopoulos, George J. Cokkinides, Rui Fan, Liangyi Sun:
Data Attack Detection and Command Authentication via Cyber-Physical Comodeling. 34-43 - Estefanía Etchevés Miciolino, Roberto Setola, Giuseppe Bernieri, Stefano Panzieri, Federica Pascucci, Marios M. Polycarpou:
Fault Diagnosis and Network Anomaly Detection in Water Infrastructures. 44-51 - Matthias Jung, Deepak M. Mathew, Carl Christian Rheinländer, Christian Weis, Norbert Wehn:
A Platform to Analyze DDR3 DRAM's Power and Retention Time. 52-59 - Jishen Zhao, Qiaosha Zou, Yuan Xie:
Overview of 3-D Architecture Design Opportunities and Techniques. 60-68 - Gabe Moretti:
Accellera's Support for ESL Verification and Stimulus Reuse. 69-75 - David Atienza, Giorgio Di Natale:
Report on DATE 2017 in Lausanne. 76-77 - Theo Theocharides:
TTTC News. 78-79 - Scott Davidson:
Practice Makes Perfect. 80
Volume 34, Number 5, October 2017
- Jörg Henkel:
Verification and Test. 4 - Magdy S. Abadir, Jayanta Bhadra, Wen Chen, Li-C. Wang:
Guest Editors' Introduction: Emerging Challenges and Solutions in SoC Verification. 5-6 - Wen Chen, Sandip Ray, Jayanta Bhadra, Magdy S. Abadir, Li-C. Wang:
Challenges and Trends in Modern SoC Design Verification. 7-22 - Wen Chen, Kuo-Kai Hsieh, Li-Chung Wang, Jayanta Bhadra:
Data-Driven Test Plan Augmentation for Platform Verification. 23-29 - Syeda Hira Taqdees, Osman Hasan:
Formally Verifying Transfer Functions of Linear Analog Circuits. 30-37 - Gianpiero Cabodi, Paolo Camurati, Sebastiano F. Finocchiaro, Francesco Savarese, Danilo Vendraminetto:
Embedded Systems Secure Path Verification at the Hardware/Software Interface. 38-46 - John Adler, Andreas G. Veneris:
Leveraging Software Configuration Management in Automated RTL Design Debug. 47-53 - Maroua Ben Slimane, Imene Ben Hafaiedh, Riadh Robbana:
Formal-Based Design and Verification of SoC Arbitration Protocols: A Comparative Analysis of TDMA and Round-Robin. 54-62 - Huanyu Wang, Domenic Forte, Mark M. Tehranipoor, Qihang Shi:
Probing Attacks on Integrated Circuits: Challenges and Research Opportunities. 63-71 - Ran Wang, Krishnendu Chakrabarty:
Tackling Test Challenges for Interposer-Based 2.5-D Integrated Circuits. 72-79 - Francky Catthoor, Guido Groeseneken:
Will Chips of the Future Learn How to Feel Pain and Cure Themselves? 80-87 - Yao-Wen Chang:
An Interview With Professor Chenming Hu, Father of 3D Transistors. 90-96 - Scott Davidson:
Engineering Secure Internet of Things Systems. 97-98 - José Luis Ayala:
IEEE Rebooting Computing Week. 99-100 - Theo Theocharides:
Test Technology TC Newsletter. 101-102 - Alvaro A. Cárdenas:
Corrections. 103 - Scott Davidson:
To Verification Infinity and Beyond. 104
Volume 34, Number 6, December 2017
- Jörg Henkel:
Self-Aware On-Chip Systems. 4-5 - Axel Jantsch, Nikil D. Dutt:
Guest Editorial: Special Issue on Self-Aware Systems on Chip. 6-7 - Axel Jantsch, Nikil D. Dutt, Amir M. Rahmani:
Self-Awareness in Systems on Chip - A Survey. 8-26 - Konstantin Shibin, Sergei Devadze, Artur Jutman, Martin Grabmann, Robin Pricken:
Health Management for Self-Aware SoCs Based on IEEE 1687 Infrastructure. 27-35 - James J. Davis, Joshua M. Levine, Edward A. Stott, Eddie Hung, Peter Y. K. Cheung, George A. Constantinides:
KOCL: Power Self- Awareness for Arbitrary FPGA-SoC-Accelerated OpenCL Applications. 36-45 - Davide Rossi, Igor Loi, Antonio Pullini, Thomas Christoph Müller, Andreas Burg, Francesco Conti, Luca Benini, Philippe Flatresse:
A Self-Aware Architecture for PVT Compensation and Power Nap in Near Threshold Processors. 46-53 - Hans Giesen, Raphael Rubin, Benjamin Gojman, André DeHon:
Self-Adaptive Timing Repair. 54-62 - Angelos Antonopoulos, Christiana Kapatsori, Yiorgos Makris:
Trusted Analog/Mixed- Signal/RF ICs: A Survey and a Perspective. 63-76 - Katherine Shu-Min Li, Sying-Jyan Wang, Ruei-Ting Gu, Bo-Chuan Cheng:
Layout-Aware Optimized Prebond Silicon Interposer Test Synthesis. 77-83 - Dongyeob Shin, Jongsun Park, Jangwon Park, Somnath Paul, Swarup Bhunia:
Adaptive ECC for Tailored Protection of Nanoscale Memory. 84-93 - Mohsen Imani, John Hwang, Tajana Rosing, Abbas Rahimi, Jan M. Rabaey:
Low-Power Sparse Hyperdimensional Encoder for Language Recognition. 94-101 - Lothar Thiele:
Internet of Things - The Quest for Trust. 102-108 - Patrick Mayor, Martin Rajman, Giovanni De Micheli:
Nano-Tera.ch: Information Technology for Health, Environment, and Energy. 109-118 - Maria K. Michael, Haralampos-G. D. Stratigopoulos:
Recap of the European Test Symposium 2017 (ETS'17). 119-120 - David Garrett, Chia-Lin Yang:
Recap of the 2017 International Symposium on Low Power Electronics and Design (ISLPED). 121-122 - José Luis Ayala:
CEDA Currents. 123-124 - Theo Theocharides:
Test Technology TC Newsletter. 125-126 - Scott Davidson:
Chips Thinking About Chips. 128
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
last updated on 2024-10-07 21:15 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
