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IEEE Design & Test of Computers, Volume 13
Volume 13, Number 1, 1996
- John W. Sheppard:
SCC20 attracts IEC participation. IEEE Des. Test Comput. 13(1): 2- (1996)
- Masaharu Imai, Eugenio Villar:
ASPDAC 1995: HDL synthesizability and interoperability. IEEE Des. Test Comput. 13(1): 3-4 (1996)
- Yervant Zorian, Jan Hlavicka:
Guest Editors' Introduction: East Meets West. IEEE Des. Test Comput. 13(1): 5-7 (1996) - Tibor Bartos, Norbert Fristacky:
Verifying Timing Consistency in Formal Specifications. 8-15 - Stanislaw J. Piestrak:
Self-Checking Design in Eastern Europe. 16-25 - Anatoly Prihozhy
:
Net Scheduling in High-Level Synthesis. 26-35 - Sergiu Radu
, Viorel Onofrei, Mihai Albulet:
Interconnection Problems in Modern Computers. 36-46 - Raimund Ubar:
Test Synthesis with Alternative Graphs. 48-57
- Mick Tegethoff, Tom Chen:
Sensitivity Analysis of Critical Parameters in Board Test. 58-63 - Joseph A. Mielke:
Frequency Domain Testing of ADCs. 64-69 - Peter H. Schneider, Ulf Schlichtmann
, Bernd Wurth:
Fast Power Estimation of Large Circuits. 70-78 - Kenneth M. Thompson:
Intel and the Myths of Test. 79-81
- IEEE Design & Test of Computers. IEEE Des. Test Comput. 13(1): 82-83 (1996)
- Design Automation Technical Committee Newsletter. IEEE Des. Test Comput. 13(1): 84-85 (1996)
- Test Technology Tc Newsletter. IEEE Des. Test Comput. 13(1): 86-87 (1996)
- Scott Davidson:
Base 1 logic: A method for environmentally friendly PC design. IEEE Des. Test Comput. 13(1): 88- (1996)
Volume 13, Number 2, 1996
- Kenneth D. Wagner, Yervant Zorian:
EIC Message. IEEE Des. Test Comput. 13(2): 2- (1996)
- Vishwani D. Agrawal:
1995 Asian Test Symposium carves a niche. IEEE Des. Test Comput. 13(2): 3- (1996)
- Hugo De Man:
Submicron design tools: problems and suppliers. IEEE Des. Test Comput. 13(2): 4, 91 (1996) - Ajit M. Prabhu, Richard L. Campbell:
Management Perspectives in EDA. IEEE Des. Test Comput. 13(2): 5-7, 90-91 (1996)
- Bozena Kaminska, Bernard Courtois:
Guest Editors' Introduction: Mixed Analog and Digital Systems. IEEE Des. Test Comput. 13(2): 8-9 (1996) - Thomas Olbrich, Andrew Richardson
:
Design and Self-Test for Switched-Current Building Blocks. 10-17 - Ashok Balivada, Jin Chen, Jacob A. Abraham:
Analog Testing with Time Response Parameters. 18-25 - Abhijit Chatterjee, Bruce C. Kim, Naveena Nagi:
DC Built-In Self-Test for Linear Analog Circuits. 26-33 - Yukiya Miura:
Real-Time Current Testing for A/D Converters. 34-41
- Stephen Dean Brown, Jonathan Rose:
FPGA and CPLD Architectures: A Tutorial. 42-57 - Raul San Martin, John P. Knight:
Optimizing Power in ASIC Behavioral Synthesis. 58-70 - Paul E. Landman, Renu Mehra, Jan M. Rabaey:
An Integrated CAD Environment for Low-Power Design. 72-82 - A D&T Roundtable Deep-Submicron Design. IEEE Des. Test Comput. 13(2): 83-89 (1996)
- Design Automation Technical Committee Newsletter. IEEE Des. Test Comput. 13(2): 93- (1996)
- Test Technology Tc Newsletter. IEEE Des. Test Comput. 13(2): 94-95 (1996)
- Scott Davidson:
A test puzzle for a TGIF morning. 96-
Volume 13, Number 3, 1996
- News. IEEE Des. Test Comput. 13(3): 4, 109 (1996)
- Yervant Zorian, Tom Anderson, Yvon Savaria, Claude Thibeault, André Ivanov:
Panel Summaries. IEEE Des. Test Comput. 13(3): 6, 110-112 (1996)
- Gil Philips, Yervant Zorian, Charles W. Rosenthal, Bozena Kaminska:
Conference Reports. IEEE Des. Test Comput. 13(3): 8, 113-144 (1996)
- Vijay K. Madisetti, Mark A. Richards:
Guest Editors' Introduction: Advances in Rapid Prototyping of Digital Systems. IEEE Des. Test Comput. 13(3): 9-11 (1996) - Vijay K. Madisetti:
Rapid Digital System Prototyping: Current Practice, Future Challenges. 12-22 - James H. M. Malley:
RASSP: Changing the Paradigm of Electronic-System Design. 23-31 - Richard M. Sedmak, John S. Evans:
Spanning the Product Life Cycle: RASSP DFT. 32-42 - Carolyn Kuttner:
Hardware-Software Codesign Using Processor Synthesis. 43-53 - Lan-Rong Dung, Vijay K. Madisetti:
Conceptual Prototyping of Scalable Embedded DSP Systems. 54-65 - Sandi Habinc, Peter Sinander:
Using VHDL for Board Level Simulation. 66-78
- Harald P. E. Vranken, Marc F. Witteman, Ronald C. van Wuijtswinkel:
Design for Testability in Hardware-Software Systems. 79-87 - Ramesh Karri
, Karin Högstedt, Alex Orailoglu:
Computer-Aided Design of Fault-Tolerant VLSI Systems. 88-96 - Adam Cron:
A D&T Special Report: P1149.4 Mixed-Signal Test Bus. 98-101 - A D&T Roundtable: Deep-Submicron Test in cooperation with the Test Technology Technical Committee. IEEE Des. Test Comput. 13(3): 102-108 (1996)
- Design Automation Technical Committee Newsletter. IEEE Des. Test Comput. 13(3): 116-117 (1996)
- Test Technology Tc Newsletter. IEEE Des. Test Comput. 13(3): 118-119 (1996)
- Scott Davidson:
How to achieve 95% fault coverage without really trying. IEEE Des. Test Comput. 13(3): 120- (1996)
Volume 13, Number 4, 1996
- News. IEEE Des. Test Comput. 13(4): 3-4, 88 (1996)
- Bernard Courtois:
Second Therminic Workshop. IEEE Des. Test Comput. 13(4): 5- (1996)
- Harold S. Stone:
Designing in the multimedia era. 6-7 - Wojciech Maly:
The future of IC design, testing, and manufacturing. 8, 89-91
- Stephen Dean Brown:
FPGA Architectural Research: A Survey. 9-15 - Stephen Dean Brown, Muhammad M. Khellah
, Zvonko G. Vranesic:
Minimizing FPGA Interconnect Delays. 16-23 - Todd A. DeLong, Barry W. Johnson, Joseph A. Profeta III:
A Fault Injection Technique for VHDL Behavioral-Level Models. 24-33 - Jacob M. Velixon:
Transmission Coefficient Correction for DACs. 34-39 - Karim Arabi, Bozena Kaminska, Janusz Rzeszut:
BIST for D/A and A/D Converters. 40-49 - Fulvio Corno
, Paolo Prinetto, Matteo Sonza Reorda
:
Circular Self-Test Path for FSMs. 50-60 - Jerry M. Soden, Charles F. Hawkins:
IDDQ Testing: Issues Present and Future. 61-65 - Koji Nakamae, Homare Sakamoto, Hiromu Fujioka:
How ATE Planning Affects LSI Manufacturing Cost. 66-73 - A D&T Roundtable: Telecommunications System Design. IEEE Des. Test Comput. 13(4): 74-81 (1996)
- IEEE Design & Test of Computers 1996 Annual Index, Volume 13. IEEE Des. Test Comput. 13(4): 82-85 (1996)
- Author Guidelines IEEE Design & Test of Computers. IEEE Des. Test Comput. 13(4): 86-87 (1996)
- Design Automation Technical Committee Newsletter. IEEE Des. Test Comput. 13(4): 93- (1996)
- Test Technology Tc Newsletter. IEEE Des. Test Comput. 13(4): 94-95 (1996)
- Robert C. Aitken:
When tools cry wolf: Testability pitfalls of synthesized designs. 96-
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