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ORCIDMichael G. Wahl
Person information
- affiliation: University of Siegen, Microsystems Engineering Group, Germany
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2020 – today
- 2021
[c15]Peter Stich, Rebecca Busch
, Michael G. Wahl, Christian Weber, Madjid Fathi:
Branch selection and data optimization for selecting machines for processes in semiconductor manufacturing using AI-based predictions. EIT 2021: 1-6- 2020
- [c14]Peter Stich, Michael G. Wahl, Peter Czerner, Christian Weber, Madjid Fathi:
Yield prediction in semiconductor manufacturing using an AI-based cascading classification system. EIT 2020: 609-614
2010 – 2019
- 2019
- [c13]Tanja Joan Eiler, Armin Grünewald, Michael G. Wahl, Rainer Brück:
AAT Meets Virtual Reality. VISIGRAPP (Revised Selected Papers) 2019: 153-176 - 2015
- [c12]Armin Grünewald, Michael G. Wahl, Rainer Brück:
Cost modeling and analysis for the design, manufacturing and test of 3D-ICs. 3DIC 2015: TS8.32.1-TS8.32.6 - 2014
- [c11]Armin Grünewald, Michael G. Wahl, Rainer Brück:
Manufacturing and test assistance for 3D-Integrated heterogeneous systems. 3DIC 2014: 1-6 - [c10]Alexander Kordes, Bart Vermeulen, Abhijit K. Deb, Michael G. Wahl:
Startup error detection and containment to improve the robustness of hybrid FlexRay networks. DATE 2014: 1-6 - [c9]Thomas Lehner, Andreas Kuhr, Michael G. Wahl, Rainer Brück:
Site dependencies in a multisite testing environment. ETS 2014: 1-6
2000 – 2009
- 2007
- [c8]Oliver Spang, Hans Martin von Staudt, Michael G. Wahl:
A sophisticated memory test engine for LCD display drivers. DATE 2007: 213-218 - 2003
- [c7]Michael G. Wahl, Sudipta Bhawmik, Kamran Zarrineh, Pradipta Ghosh, Scott Davidson, Peter Harrod:
The P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data. ITC 2003: 998-1007 - 2001
- [c6]Michael G. Wahl, Anthony P. Ambler, Christoph Maaß, Mohammed Rahman:
From DFT to systems test - a model based cost optimization tool. DATE 2001: 302-306
1990 – 1999
- 1998
- [c5]Manfred Koegst, Dieter Garte, Peter Conradi, Michael G. Wahl:
A Systematic Analysis of Reuse Strategies for Design of Electronic Circuits. DATE 1998: 292-296 - [c4]Michael G. Wahl, Holger Völkel:
A VHDL SGRAM Model for the Validation Environment of a High Performance Graphic Processor. DATE 1998: 937-938 - 1997
- [c3]Peter Conradi, Ulrich Heinkel, Michael G. Wahl:
Introducing multimedia in teaching of digital system design. MSE 1997: 89-90 - 1992
- [c2]Michael G. Wahl, Carol Pyron:
EDIF Test - The Upcoming Standard for Test Data Transfers. ITC 1992: 453-458 - 1990
- [c1]William W. Sebesta, Bas Verhelst, Michael G. Wahl:
Development of a new standard for test. ITC 1990: 988-993
1980 – 1989
- 1989
- [j1]Johannes Pfeifer, Michael G. Wahl, Hans Wojtkowiak:
Data exchange formats for testing. Microprocessing and Microprogramming 27(1-5): 687-693 (1989)
Coauthor Index
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