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Michel Mermet-Guyennet
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Journal Articles
- 2011
- [j16]Xavier Perpiñà
, Xavier Jordà
, Miquel Vellvehí
, José Rebollo
, Michel Mermet-Guyennet:
Long-Term Reliability of Railway Power Inverters Cooled by Heat-Pipe-Based Systems. IEEE Trans. Ind. Electron. 58(7): 2662-2672 (2011) - [j15]Xavier Perpiñà
, Jean-François Serviere, Jesús Urresti-Ibañez
, Ignasi Cortés, Xavier Jordà
, Salvador Hidalgo
, José Rebollo
, Michel Mermet-Guyennet:
Analysis of Clamped Inductive Turnoff Failure in Railway Traction IGBT Power Modules Under Overload Conditions. IEEE Trans. Ind. Electron. 58(7): 2706-2714 (2011) - 2009
- [j14]Alexandre Micol, Carmen Martin, Olivier Dalverny
, Michel Mermet-Guyennet, Moussa Karama
:
Reliability of lead-free solder in power module with stochastic uncertainty. Microelectron. Reliab. 49(6): 631-641 (2009) - 2008
- [j13]X. Perpiñà
, Jean-François Serviere, Xavier Jordà
, A. Fauquet, Salvador Hidalgo
, Jesús Urresti-Ibañez
, José Rebollo
, Michel Mermet-Guyennet:
IGBT module failure analysis in railway applications. Microelectron. Reliab. 48(8-9): 1427-1431 (2008) - [j12]Jean-Luc Fock Sui Too, B. Chauchat, Patrick Austin, Patrick Tounsi, Michel Mermet-Guyennet, Régis Meuret:
Performance and reliability testing of modern IGBT devices under typical operating conditions of aeronautic applications. Microelectron. Reliab. 48(8-9): 1453-1458 (2008) - 2007
- [j11]Pierre Solomalala, J. Saiz, Michel Mermet-Guyennet, Alberto Castellazzi
, Mauro Ciappa, X. Chauffleur, Jean-Pierre Fradin:
Virtual reliability assessment of integrated power switches based on multi-domain simulation approach. Microelectron. Reliab. 47(9-11): 1343-1348 (2007) - [j10]Michel Mermet-Guyennet, X. Perpiñà
, M. Piton:
Revisiting power cycling test for better life-time prediction in traction. Microelectron. Reliab. 47(9-11): 1690-1695 (2007) - [j9]X. Perpiñà
, M. Piton, Michel Mermet-Guyennet, Xavier Jordà
, José Millán:
Local thermal cycles determination in thermosyphon-cooled traction IGBT modules reproducing mission profiles. Microelectron. Reliab. 47(9-11): 1701-1706 (2007) - [j8]Davide Barlini, Mauro Ciappa, Michel Mermet-Guyennet, Wolfgang Fichtner:
Measurement of the transient junction temperature in MOSFET devices under operating conditions. Microelectron. Reliab. 47(9-11): 1707-1712 (2007) - [j7]Alberto Castellazzi
, Mauro Ciappa, Wolfgang Fichtner, M. Piton, Michel Mermet-Guyennet:
A study of the threshold-voltage suitability as an application-related reliability indicator for planar-gate non-punch-through IGBTs. Microelectron. Reliab. 47(9-11): 1713-1718 (2007) - [j6]Jesús Urresti-Ibañez
, Alberto Castellazzi
, M. Piton, José Rebollo
, Michel Mermet-Guyennet, Mauro Ciappa:
Robustness test and failure analysis of IGBT modules during turn-off. Microelectron. Reliab. 47(9-11): 1725-1729 (2007) - [j5]T. Lhommeau, Xavier Perpiñà
, C. Martin, Régis Meuret, Michel Mermet-Guyennet, Moussa Karama
:
Thermal fatigue effects on the temperature distribution inside IGBT modules for zone engine aeronautical applications. Microelectron. Reliab. 47(9-11): 1779-1783 (2007) - [j4]X. Perpiñà
, Alberto Castellazzi
, M. Piton, Michel Mermet-Guyennet, José Millán:
Failure-relevant abnormal events in power inverters considering measured IGBT module temperature inhomogeneities. Microelectron. Reliab. 47(9-11): 1784-1789 (2007) - 2006
- [j3]Alberto Castellazzi
, Mauro Ciappa, Wolfgang Fichtner, G. Lourdel, Michel Mermet-Guyennet:
Compact modelling and analysis of power-sharing unbalances in IGBT-modules used in traction applications. Microelectron. Reliab. 46(9-11): 1754-1759 (2006) - [j2]Davide Barlini, Mauro Ciappa, Alberto Castellazzi
, Michel Mermet-Guyennet, Wolfgang Fichtner:
New technique for the measurement of the static and of the transient junction temperature in IGBT devices under operating conditions. Microelectron. Reliab. 46(9-11): 1772-1777 (2006) - [j1]X. Perpiñà
, Jean-François Serviere, J. Saiz, Davide Barlini, Michel Mermet-Guyennet, José Millán:
Temperature measurement on series resistance and devices in power packs based on on-state voltage drop monitoring at high current. Microelectron. Reliab. 46(9-11): 1834-1839 (2006)
Conference and Workshop Papers
- 2018
- [c1]Thomas Lagier, Laurent Chedot, François Wallart, Layal Ghossein, Bruno Lefebvre, Piotr Dworakowski
, Michel Mermet-Guyennet, Cyril Buttay
:
A 100 kW 1.2 kV 20 kHz DC-DC converter prototype based on the Dual Active Bridge topology. ICIT 2018: 559-564
Coauthor Index
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