"Performance and reliability testing of modern IGBT devices under typical ..."

Jean-Luc Fock Sui Too et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.07.051

access: closed

type: Journal Article

metadata version: 2021-02-22

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Jean-Luc Fock Sui Too, B. Chauchat, Patrick Austin, Patrick Tounsi, Michel Mermet-Guyennet, Régis Meuret:
Performance and reliability testing of modern IGBT devices under typical operating conditions of aeronautic applications. Microelectron. Reliab. 48(8-9): 1453-1458 (2008)

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