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Roberto Lacerda de Orio

R. L. de Orio

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Journal Articles

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2017
[j6]
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Rafael O. Nunes, R. L. de Orio:
Study of the impact of electromigration on integrated circuit performance and reliability at design level. Microelectron. Reliab. 76-77: 75-80 (2017)
2012
[j5]
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Hajdin Ceric, Roberto Lacerda de Orio, Siegfried Selberherr:
Interconnect reliability dependence on fast diffusivity paths. Microelectron. Reliab. 52(8): 1532-1538 (2012)
[j4]
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Roberto Lacerda de Orio, Hajdin Ceric, Siegfried Selberherr:
Electromigration failure in a copper dual-damascene structure with a through silicon via. Microelectron. Reliab. 52(9-10): 1981-1986 (2012)
2011
[j3]
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Stanislav Tyaginov, Ivan A. Starkov, Hubert Enichlmair, C. Jungemann, Jong Mun Park, Ehrenfried Seebacher, R. L. de Orio, Hajdin Ceric, Tibor Grasser:
An analytical approach for physical modeling of hot-carrier induced degradation. Microelectron. Reliab. 51(9-11): 1525-1529 (2011)
[j2]
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R. L. de Orio, Hajdin Ceric, Siegfried Selberherr:
A compact model for early electromigration failures of copper dual-damascene interconnects. Microelectron. Reliab. 51(9-11): 1573-1577 (2011)
2010
[j1]
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R. L. de Orio, Hajdin Ceric, Siegfried Selberherr:
Physically based models of electromigration: From Black's equation to modern TCAD models. Microelectron. Reliab. 50(6): 775-789 (2010)

Conference and Workshop Papers

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2023
[c7]
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Mario Bendra, Simone Fiorentini, Johannes Ender, R. L. de Orio, T. Hadámek, Nils Petter Jørstad, Bernhard Pruckner, Siegfried Selberherr, Wolfgang Goes, Viktor Sverdlov:
Back-Hopping in Ultra-Scaled MRAM Cells. MIPRO 2023: 159-162
2022
[c6]
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Hajdin Ceric, Roberto Lacerda de Orio, Siegfried Selberherr:
Impact of Gold Interconnect Microstructure on Electromigration Failure Time Statistics. ESSDERC 2022: 301-303
[c5]
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Simone Fiorentini, Mario Bendra, Johannes Ender, Roberto Lacerda de Orio, Wolfgang Goes, Siegfried Selberherr, Viktor Sverdlov:
Spin Torques in ULTRA-Scaled MRAM Devices. ESSDERC 2022: 348-351
[c4]
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Mario Bendra, Simone Fiorentini, Johannes Ender, R. L. de Orio, T. Hadámek, W. J. Loch, Nils Petter Jørstad, Siegfried Selberherr, Wolfgang Goes, Viktor Sverdlov:
Spin Transfer Torques in Ultra-Scaled MRAM Cells. MIPRO 2022: 129-132
2021
[c3]
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Mario Bendra, Johannes Ender, Simone Fiorentini, T. Hadámek, Roberto Lacerda de Orio, Wolfgang Goes, Viktor Sverdlov, Siegfried Selberherr:
Finite Element Method Approach to MRAM Modeling. MIPRO 2021: 70-73
2019
[c2]
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  - conf/essderc/OrioMSGEFS19
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Roberto Lacerda de Orio, Alexander Makarov, Siegfried Selberherr, Wolfgang Goes, Johannes Ender, Simone Fiorentini, Viktor Sverdlov:
Switching Speedup of the Magnetic Free Layer of Advanced SOT-MRAM. ESSDERC 2019: 146-149
2018
[c1]
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  - conf/sbcci/NunesO18
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Rafael O. Nunes, R. L. de Orio:
Operational Amplifier Performance Degradation and Time-to-Failure due to Electromigration. SBCCI 2018: 1-6

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