Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Interconnect reliability dependence on fast diffusivity paths."

Hajdin Ceric, Roberto Lacerda de Orio, Siegfried Selberherr (2012)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2011.09.035

access: closed

type: Journal Article

metadata version: 2021-10-14

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/CericOS12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/CericOS12
Hajdin Ceric, Roberto Lacerda de Orio, Siegfried Selberherr:
Interconnect reliability dependence on fast diffusivity paths. Microelectron. Reliab. 52(8): 1532-1538 (2012)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.