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Soumitra Bose
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Journal Articles
- 2005
- [j8]Soumitra Bose, Amit Nandi:
Schematic array models for associative and non-associative memory circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(10): 1582-1593 (2005) - 2004
- [j7]Soumitra Bose:
Modeling Custom Digital Circuits for Test. J. Electron. Test. 20(6): 591-609 (2004) - 1998
- [j6]Soumitra Bose, Prathima Agrawal, Vishwani D. Agrawal:
Deriving Logic Systems for Path Delay Test Generation. IEEE Trans. Computers 47(8): 829-846 (1998) - [j5]Soumitra Bose, Prathima Agrawal, Vishwani D. Agrawal:
A rated-clock test method for path delay faults. IEEE Trans. Very Large Scale Integr. Syst. 6(2): 323-331 (1998) - [j4]Soumitra Bose, Prathima Agrawal:
Concurrent fault simulation on message passing multicomputers. IEEE Trans. Very Large Scale Integr. Syst. 6(2): 332-342 (1998) - 1993
- [j3]Soumitra Bose, Prathima Agrawal, Vishwani D. Agrawal:
The optimistic update theorem for path delay testing in sequential circuits. J. Electron. Test. 4(3): 285-290 (1993) - [j2]Soumitra Bose, Prathima Agrawal, Vishwani D. Agrawal:
Path delay fault simulation of sequential circuits. IEEE Trans. Very Large Scale Integr. Syst. 1(4): 453-461 (1993) - 1992
- [j1]Soumitra Bose, Edmund M. Clarke, David E. Long, Spiro Michaylov:
PARTHENON: A Parallel Theorem Prover for Non-Horn Clauses. J. Autom. Reason. 8(2): 153-181 (1992)
Conference and Workshop Papers
- 2007
- [c17]Soumitra Bose, Vishwani D. Agrawal:
Estimating stuck fault coverage in sequential logic using state traversal and entropy analysis. ITC 2007: 1-10 - [c16]Soumitra Bose, Hillary Grimes, Vishwani D. Agrawal:
Delay fault simulation with bounded gate delay mode. ITC 2007: 1-10 - [c15]Soumitra Bose, Vishwani D. Agrawal:
Delay Test Quality Evaluation Using Bounded Gate Delays. VTS 2007: 23-28 - 2006
- [c14]Soumitra Bose, Vishwani D. Agrawal:
Fault Coverage Estimation for Non-Random Functional Input Sequences. ITC 2006: 1-10 - [c13]Vishwani D. Agrawal, Soumitra Bose, Vijay Gangaram:
Upper Bounding Fault Coverage by Structural Analysis and Signal Monitoring. VTS 2006: 88-93 - 2004
- [c12]Soumitra Bose, Amit Nandi:
Extraction of Schematic Array Models for Memory Circuits. DATE 2004: 570-577 - 2002
- [c11]Soumitra Bose:
Automated Modeling of Custom Digital Circuits for Test. DATE 2002: 954-961 - 1997
- [c10]Soumitra Bose, Vishwani D. Agrawal, Thomas G. Szymanski:
Algorithms for Switch Level Delay Fault Simulation. ITC 1997: 982-991 - 1995
- [c9]Soumitra Bose, Vishwani D. Agrawal:
Sequential logic path delay test generation by symbolic analysis. Asian Test Symposium 1995: 353- - 1993
- [c8]Soumitra Bose, Prathima Agrawal, Vishwani D. Agrawal:
Logic systems for path delay test generation. EURO-DAC 1993: 200-205 - [c7]Soumitra Bose, Prathima Agrawal, Vishwani D. Agrawal:
Delay fault testability evaluation through timing simulation. Great Lakes Symposium on VLSI 1993: 18-21 - [c6]Soumitra Bose, Prathima Agrawal, Vishwani D. Agrawal:
Generation of Compact Delay Tests by Multiple-Path Activation. ITC 1993: 714-723 - [c5]Soumitra Bose, Prathima Agrawal, Vishwani D. Agrawal:
A Path Delay Fault Simulator for Sequential Circuits. VLSI Design 1993: 269-274 - 1992
- [c4]Soumitra Bose, Prathima Agrawal:
Concurrent Fault Simulation of Logic Gates and Memory Blocks on Message Passing Multicomputers. DAC 1992: 332-335 - 1989
- [c3]Soumitra Bose, Allan L. Fisher:
Verifying pipelined hardware using symbolic logic simulation. ICCD 1989: 217-221 - [c2]Soumitra Bose, Edmund M. Clarke, David E. Long, Spiro Michaylov:
PARTHENON: A Parallel Theorem Prover for Non-Horn Clauses. LICS 1989: 80-89 - 1988
- [c1]P. E. Allen, Soumitra Bose, Edmund M. Clarke, Spiro Michaylov:
PARTHENON: A Parallel Theorem Prover for Non-Horn Clauses. CADE 1988: 764-765
Coauthor Index
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