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M. Wieberneit

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Journal Articles

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2010
[j3]
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Claus Hartmann, M. Wieberneit:
Investigation on BIST assisted failure analysis on digital integrated circuits. Microelectron. Reliab. 50(9-11): 1464-1468 (2010)
2009
[j2]
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Claus Hartmann, M. Wieberneit:
Investigation on marginal failure characteristics and related defects analysed by soft defect localization. Microelectron. Reliab. 49(9-11): 1137-1142 (2009)
2008
[j1]
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Claus Hartmann, M. Wieberneit:
Layout analysis as supporting tool for failure localization: Basic principles and case studies. Microelectron. Reliab. 48(8-9): 1343-1348 (2008)

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