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"Layout analysis as supporting tool for failure localization: Basic ..."

Claus Hartmann, M. Wieberneit (2008)

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DOI: 10.1016/J.MICROREL.2008.07.056

access: closed

type: Journal Article

metadata version: 2020-09-04

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Claus Hartmann, M. Wieberneit:
Layout analysis as supporting tool for failure localization: Basic principles and case studies. Microelectron. Reliab. 48(8-9): 1343-1348 (2008)

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