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C. Hainaut

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2010 – 2019

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2011
[j2]
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G. A. Koné, Brice Grandchamp, C. Hainaut, François Marc, Cristell Maneux, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean Godin:
Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses. Microelectron. Reliab. 51(9-11): 1730-1735 (2011)
2010
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G. A. Koné, Brice Grandchamp, C. Hainaut, François Marc, Cristell Maneux, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Jean Godin:
Preliminary results of storage accelerated aging test on InP/InGaAs DHBT. Microelectron. Reliab. 50(9-11): 1548-1553 (2010)

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