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"Preliminary results of storage accelerated aging test on InP/InGaAs DHBT."

G. A. Koné et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.07.141

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/KoneGHMMLZNG10
G. A. Koné, Brice Grandchamp, C. Hainaut, François Marc, Cristell Maneux, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Jean Godin:
Preliminary results of storage accelerated aging test on InP/InGaAs DHBT. Microelectron. Reliab. 50(9-11): 1548-1553 (2010)

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