Stop the war!Остановите войну!
for scientists:
default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDPaul K. Hurley
Person information
- affiliation: National University of Ireland, University College Cork, Department of Chemistry and Tyndall, Ireland
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2010 – 2019
- 2017
[c2]Gioele Mirabelli
, Farzan Gity, Scott Monaghan, Paul K. Hurley, Ray Duffy:
Impact of impurities, interface traps and contacts on MoS2 MOSFETs: Modelling and experiments. ESSDERC 2017: 288-291- [c1]Patrick Ponath, Agham B. Posadas, Yuan Ren, Xiaoyu Wu, Keji Lai, Alex Demkov, Michael Schmidt, Ray Duffy, Paul K. Hurley, Jian Wang, Chadwin D. Young, Rama K. Vasudevan, M. Baris Okatan, Stephen Jesse, Sergei V. Kalinin:
Advances of the development of a ferroelectric field-effect transistor on Ge(001). ICICDT 2017: 1-3 - 2013
- [j11]X. Saura, D. Moix, Jordi Suñé, Paul K. Hurley, Enrique Miranda:
Direct observation of the generation of breakdown spots in MIM structures under constant voltage stress. Microelectron. Reliab. 53(9-11): 1257-1260 (2013) - 2010
- [j10]Enrique Miranda, Eamon O'Connor, Paul K. Hurley:
Exploratory analysis of the breakdown spots spatial distribution in metal gate/high-K/III-V stacks using functional summary statistics. Microelectron. Reliab. 50(9-11): 1294-1297 (2010)
2000 – 2009
- 2009
- [j9]Enrique Miranda, Javier Martín-Martínez, Eamon O'Connor, G. Hughes, P. Casey, Karim Cherkaoui, S. Monaghan, R. Long, D. O'Connell, Paul K. Hurley:
Effects of the electrical stress on the conduction characteristics of metal gate/MgO/InP stacks. Microelectron. Reliab. 49(9-11): 1052-1055 (2009) - 2007
- [j8]Octavian Buiu, Steve Hall, Olof Engström, B. Raeissi, Max Christian Lemme, Paul K. Hurley, Karim Cherkaoui:
Extracting the relative dielectric constant for "high-kappa layers" from CV measurements - Errors and error propagation. Microelectron. Reliab. 47(4-5): 678-681 (2007) - [j7]Richard A. Farrell, Karim Cherkaoui, Nikolay Petkov, Heinz Amenitsch, Justin D. Holmes, Paul K. Hurley, Michael A. Morris:
Physical and electrical properties of low dielectric constant self-assembled mesoporous silica thin films. Microelectron. Reliab. 47(4-5): 759-763 (2007) - [j6]Paul K. Hurley, Karim Cherkaoui, S. McDonnell, G. Hughes, A. W. Groenland:
Characterisation and passivation of interface defects in (1 0 0)-Si/SiO2/HfO2/TiN gate stacks. Microelectron. Reliab. 47(8): 1195-1201 (2007) - 2005
- [j5]Paul K. Hurley:
Editorial. Microelectron. Reliab. 45(5-6): 767-769 (2005) - [j4]J. M. Decams, H. Guillon, Carmen Jiménez, M. Audier, J. P. Sénateur, C. Dubourdieu, O. Cadix, Barry J. O'Sullivan, Mircea Modreanu, Paul K. Hurley:
Electrical characterization of HfO2 films obtained by UV assisted injection MOCVD. Microelectron. Reliab. 45(5-6): 929-932 (2005) - [j3]Q. Fang, I. Liaw, Mircea Modreanu, Paul K. Hurley, I. W. Boyd:
Post deposition UV-induced O2 annealing of HfO2 thin films. Microelectron. Reliab. 45(5-6): 957-960 (2005) - [j2]Y. Lu, Octavian Buiu, Steve Hall, Paul K. Hurley:
Optical and electrical characterization of hafnium oxide deposited by MOCVD. Microelectron. Reliab. 45(5-6): 965-968 (2005) - 2001
- [j1]Barry J. O'Sullivan, Paul K. Hurley, F. N. Cubaynes, P. A. Stolk, F. P. Widdershoven:
Flat band voltage shift and oxide properties after rapid thermal annealing. Microelectron. Reliab. 41(7): 1053-1056 (2001)
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from 
to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the 
of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from 
, 
, and 
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from 
.
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-06-18 22:57 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
