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"Effects of the electrical stress on the conduction characteristics of ..."

Enrique Miranda et al. (2009)

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DOI: 10.1016/J.MICROREL.2009.06.017

access: closed

type: Journal Article

metadata version: 2022-01-11

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  - https://dblp.org/rec/journals/mr/MirandaMOHCCMLOH09
Enrique Miranda, Javier Martín-Martínez, Eamon O'Connor, G. Hughes, P. Casey, Karim Cherkaoui, S. Monaghan, R. Long, D. O'Connell, Paul K. Hurley:
Effects of the electrical stress on the conduction characteristics of metal gate/MgO/InP stacks. Microelectron. Reliab. 49(9-11): 1052-1055 (2009)

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