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Anne Meixner
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Journal Articles
- 2004
- [j1]T. M. Mak, Mike Tripp, Anne Meixner:
Testing Gbps Interfaces without a Gigahertz Tester. IEEE Des. Test Comput. 21(4): 278-286 (2004)
Conference and Workshop Papers
- 2013
- [c10]Samed Maltabas, Osman Kubilay Ekekon, Kemal Kulovic, Anne Meixner, Martin Margala
:
An IDDQ BIST approach to characterize phase-locked loop parameters. VTS 2013: 1-6 - 2012
- [c9]Anne Meixner, Salem Abdennadher:
Improving IO test and system evaluation via data sharing. DTIS 2012: 1-6 - 2011
- [c8]Ender Yilmaz, Anne Meixner, Sule Ozev:
An industrial case study of analog fault modeling. VTS 2011: 178-183 - 2008
- [c7]Anne Meixner, Akira Kakizawa, Benoit Provost, Serge Bedwani:
External Loopback Testing Experiences with High Speed Serial Interfaces. ITC 2008: 1-10 - 2004
- [c6]Mike Tripp, T. M. Mak, Anne Meixner:
Design considerations and DFT to enable testing of digital interfaces. CICC 2004: 197-205 - [c5]Mike Tripp, T. M. Mak, Anne Meixner:
Elimination of Traditional Functional Testing of Interface Timings at Intel. ITC 2004: 1448-1456 - 2003
- [c4]Mike Tripp, T. M. Mak, Anne Meixner:
Elimination of Traditional Functional Testing of Interface Timings at Intel. ITC 2003: 1014-1022 - 1997
- [c3]Anne Meixner, Jash Banik:
Weak Write Test Mode: An SRAM Cell Stability Design for Test Technique. ITC 1997: 1043-1052 - 1996
- [c2]Anne Meixner, Jash Banik:
Weak Write Test Mode: An SRAM Cell Stability Design for Test Technique. ITC 1996: 309-318 - 1991
- [c1]Anne Meixner, Wojciech Maly:
Fault Modeling for the Testing of Mixed Integrated Circuits. ITC 1991: 564-572
Coauthor Index
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