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ORCIDShuanlong Niu
Person information
- affiliation: Huazhong University of Science and Technology, School of Mechanical Science and Engineering, Wuhan, China
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2020 – today
- 2024
[j10]Zhenrong Wang, Bin Li
, Weifeng Li, Shuanlong Niu, Miao Wang, Tongzhi Niu:
NAS-ASDet: An adaptive design method for surface defect detection network using neural architecture search. Adv. Eng. Informatics 61: 102500 (2024)- [j9]Shuanlong Niu, Yaru Peng, Bin Li, Yuanhong Qiu, Tongzhi Niu, Weifeng Li:
A novel deep learning motivated data augmentation system based on defect segmentation requirements. J. Intell. Manuf. 35(2): 687-701 (2024) - [j8]Weifeng Li, Bin Li, Zhenrong Wang, Chaochao Qiu, Shuanlong Niu, Xin Tan, Tongzhi Niu:
A drift detection method for industrial images based on a defect segmentation model. Knowl. Based Syst. 301: 112320 (2024) - 2023
- [j7]Weifeng Li, Bin Li, Shuanlong Niu, Zhenrong Wang, Baohui Liu, Tongzhi Niu:
Selecting informative data for defect segmentation from imbalanced datasets via active learning. Adv. Eng. Informatics 56: 101933 (2023) - [j6]Shuanlong Niu, Yaru Peng, Bin Li, Xinggang Wang:
A transformed-feature-space data augmentation method for defect segmentation. Comput. Ind. 147: 103860 (2023) - [i1]Zhenrong Wang, Bin Li, Weifeng Li, Shuanlong Niu, Wang Miao, Tongzhi Niu:
NAS-ASDet: An Adaptive Design Method for Surface Defect Detection Network using Neural Architecture Search. CoRR abs/2311.10952 (2023) - 2022
- [j5]Shuanlong Niu, Bin Li, Xinggang Wang, Songping He, Yaru Peng:
Defect attention template generation cycleGAN for weakly supervised surface defect segmentation. Pattern Recognit. 123: 108396 (2022) - [j4]Yuanhong Qiu, Shuanlong Niu, Tongzhi Niu, Weifeng Li, Bin Li:
Joint-Prior-Based Uneven Illumination Image Enhancement for Surface Defect Detection. Symmetry 14(7): 1473 (2022) - [j3]Shuanlong Niu, Bin Li, Xinggang Wang, Yaru Peng:
Region- and Strength-Controllable GAN for Defect Generation and Segmentation in Industrial Images. IEEE Trans. Ind. Informatics 18(7): 4531-4541 (2022) - 2020
- [j2]Yuanhong Qiu, Lixin Tang, Bin Li, Suanlong Niu, Tongzhi Niu:
Uneven Illumination Surface Defects Inspection Based on Saliency Detection and Intrinsic Image Decomposition. IEEE Access 8: 190663-190676 (2020) - [j1]Shuanlong Niu, Bin Li, Xinggang Wang, Hui Lin:
Defect Image Sample Generation With GAN for Improving Defect Recognition. IEEE Trans Autom. Sci. Eng. 17(3): 1611-1622 (2020)
2010 – 2019
- 2019
- [c1]Shuanlong Niu, Hui Lin, Tongzhi Niu, Bin Li, Xinggang Wang:
DefectGAN: Weakly-Supervised Defect Detection using Generative Adversarial Network. CASE 2019: 127-132
Coauthor Index
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