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"Defect Image Sample Generation With GAN for Improving Defect Recognition."

Shuanlong Niu et al. (2020)

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DOI: 10.1109/TASE.2020.2967415

access: closed

type: Journal Article

metadata version: 2023-09-30

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  - https://dblp.org/rec/journals/tase/NiuLWL20
Shuanlong Niu, Bin Li, Xinggang Wang, Hui Lin:
Defect Image Sample Generation With GAN for Improving Defect Recognition. IEEE Trans Autom. Sci. Eng. 17(3): 1611-1622 (2020)

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