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Yongkang Xue

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2020 – today

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2024
[j4]
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  - journals/chinaf/RenXJZWJ24
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  - https://dblp.org/rec/journals/chinaf/RenXJZWJ24
Pengpeng Ren, Yongkang Xue, Linglin Jing, Lining Zhang, Runsheng Wang, Zhigang Ji:
A strong physical unclonable function with machine learning immunity for Internet of Things application. Sci. China Inf. Sci. 67(1) (2024)
[j3]
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  - journals/tcad/YeRXFJ24
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Jinfeng Ye, Pengpeng Ren, Yongkang Xue, Hui Fang, Zhigang Ji:
Fast Aging-Aware Timing Analysis Framework With Temporal-Spatial Graph Neural Network. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43(6): 1862-1871 (2024)
[c7]
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  - conf/irps/XiaZWFXSWRJH24
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Shiyu Xia, Longda Zhou, Kewei Wang, Xiaobin Fan, Yongkang Xue, Qi Shan, Hannian Wang, Pengpeng Ren, Zhigang Ji, Ru Huang:
Convolution-Based Vth Shift Prediction and the New 9T2C Pixel Circuit in LTPS TFT AMOLED. IRPS 2024: 1-7
[c6]
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Yongkang Xue, Miaojia Yuan, Yu Li, Da Wang, Maokun Wu, Pengpeng Ren, Lining Zhang, Runsheng Wang, Zhigang Ji, Ru Huang:
Investigation of Positive Bias Temperature Instability in advanced FinFET nodes. IRPS 2024: 1-5
[c5]
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  - conf/irps/WangXLRSWLCYLWCWJH24
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Da Wang, Yongkang Xue, Yong Liu, Pengpeng Ren, Zixuan Sun, Zirui Wang, Yueyang Liu, Zhijun Cheng, Haiyang Yang, Xiangli Liu, Blacksmith Wu, Kanyu Cao, Runsheng Wang, Zhigang Ji, Ru Huang:
Sub-20-nm DRAM Technology under Negative Bias Temperature Instability (NBTI): from Characterization to Physical Origin Identification. IRPS 2024: 9
[c4]
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  - conf/irps/SunXLRWJWH24
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Zixuan Sun, Yongkang Xue, Haoran Lu, Pengpeng Ren, Zirui Wang, Zhigang Ji, Runsheng Wang, Ru Huang:
Investigation of Interplays between Body Biasing and Hot Carrier Degradation (HCD) in Advanced NMOS FinFETs. IRPS 2024: 72
[c3]
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  - conf/irps/XiaoZWXRJ24
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Yu Xiao, Chenyang Zhang, Da Wang, Yongkang Xue, Pengpeng Ren, Zhigang Ji:
A New Method of Automatic Extraction of RTN and OMI-Friendly Implementation. IRPS 2024: 75
2023
[c2]
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  - conf/irps/SunLXLWZJWH23
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Zixuan Sun, Haoran Lu, Yongkang Xue, Wenpu Luo, Zirui Wang, Jiayang Zhang, Zhigang Ji, Runsheng Wang, Ru Huang:
Investigation of Hot Carrier Enhanced Body Bias Effect in Advanced FinFET Technology. IRPS 2023: 1-6
[c1]
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  - conf/vlsit/DongSYLXLCWWZWR23
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Zuoyuan Dong, Zixuan Sun, Xin Yang, Xiaomei Li, Yongkang Xue, Chen Luo, Puyang Cai, Zirui Wang, Shuying Wang, Yewei Zhang, Chaolun Wang, Pengpeng Ren, Zhigang Ji, Xing Wu, Runsheng Wang, Ru Huang:
Catching the Missing EM Consequence in Soft Breakdown Reliability in Advanced FinFETs: Impacts of Self-heating, On-State TDDB, and Layout Dependence. VLSI Technology and Circuits 2023: 1-2
2022
[j2]
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  - journals/remotesensing/GanemXRFOCCRDS22
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Khalil Ali Ganem, Yongkang Xue, Ariane de Almeida Rodrigues, Washington Franca-Rocha, Marceli Terra de Oliveira, Nathália S. Carvalho, Efrain Yury Turpo Cayo, Marcos Reis Rosa, Andeise Cerqueira Dutra, Yosio Edemir Shimabukuro:
Mapping South America's Drylands through Remote Sensing - A Review of the Methodological Trends and Current Challenges. Remote. Sens. 14(3): 736 (2022)

2010 – 2019

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2016
[j1]
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  - journals/remotesensing/RishmawiPX16
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Khaldoun Rishmawi, Stephen D. Prince, Yongkang Xue:
Vegetation Responses to Climate Variability in the Northern Arid to Sub-Humid Zones of Sub-Saharan Africa. Remote. Sens. 8(11): 910 (2016)

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