"Catching the Missing EM Consequence in Soft Breakdown Reliability in ..."

Zuoyuan Dong et al. (2023)

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DOI: 10.23919/VLSITECHNOLOGYANDCIR57934.2023.10185380

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-03

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Zuoyuan Dong, Zixuan Sun, Xin Yang, Xiaomei Li, Yongkang Xue, Chen Luo, Puyang Cai, Zirui Wang, Shuying Wang, Yewei Zhang, Chaolun Wang, Pengpeng Ren, Zhigang Ji, Xing Wu, Runsheng Wang, Ru Huang:
Catching the Missing EM Consequence in Soft Breakdown Reliability in Advanced FinFETs: Impacts of Self-heating, On-State TDDB, and Layout Dependence. VLSI Technology and Circuits 2023: 1-2

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