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Fangmei Wu
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Journal Articles
- 2010
- [j1]Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Mohammad Tehranipoor, Xiaoqing Wen, Nisar Ahmed:
A Comprehensive Analysis of Transition Fault Coverage and Test Power Dissipation for Launch-Off-Shift and Launch-Off-Capture Schemes. J. Low Power Electron. 6(2): 359-374 (2010)
Conference and Workshop Papers
- 2011
- [c9]Kohei Miyase, Y. Uchinodan, Kazunari Enokimoto, Yuta Yamato, Xiaoqing Wen, Seiji Kajihara, Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Arnaud Virazel:
Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling. Asian Test Symposium 2011: 90-95 - 2010
- [c8]Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Junxia Ma, Wei Zhao, Mohammad Tehranipoor, Xiaoqing Wen:
Analysis of power consumption and transition fault coverage for LOS and LOC testing schemes. DDECS 2010: 376-381 - [c7]Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Mohammad Tehranipoor, Kohei Miyase, Xiaoqing Wen, Nisar Ahmed:
Is test power reduction through X-filling good enough? ITC 2010: 805 - 2003
- [c6]Fangmei Wu, Lei Huang:
Efficiency Analysis and Safety Assessment of Automatic Testing for Safety-Critical Software. Asian Test Symposium 2003: 106-109 - 1999
- [c5]Fangmei Wu, Meng Li:
Railway Signaling Safety-critical Software Testing Based on Dynamic Decision Table. Asian Test Symposium 1999: 247-250 - [c4]Zhongwei Xu, Fangmei Wu:
A Novel Testing Approach for Safety-Critical Software. Asian Test Symposium 1999: 251-255 - [c3]Haiying Tu, Fangmei Wu:
How to Design an Environment Simulator for Safety Critical Software Testing. Asian Test Symposium 1999: 256- - [c2]Yi Yu, Fangmei Wu:
A Software Acceptance Testing Technique Based on Knowledge Accumulation. Great Lakes Symposium on VLSI 1999: 296-299 - 1998
- [c1]Haiying Tu, Fangmei Wu, Xiaoxu Ren:
Rough-Hierarchical Testing for Safety Critical Software. Asian Test Symposium 1998: 126-130
Coauthor Index
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