Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

Neha Gupta 0003

> Home > Persons

Person information

affiliation: Delhi Technological University, Microelectronics Research Lab, India

Other persons with the same name

see FAQ

Refine list

refinements active!

zoomed in on ?? of ?? records

view refined list in

export refined list as

showing all ?? records

2010 – 2019

see FAQ

What is the meaning of the colors in the publication lists?

2019
[c3]
- view
  authority control:
- export record
  dblp key:
  - conf/mocast/00040TC19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/mocast/00040TC19
Ajay Kumar, Neha Gupta, Madan Mohan Tripathi, Rishu Chaujar:
Non-Quasi-Static Small-Signal Modeling of TGRC MOSFET in Parameter Perspective for RF/Microwave Applications. MOCAST 2019: 1-4
[c2]
- view
  authority control:
- export record
  dblp key:
  - conf/tencon/00040STTC19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/tencon/00040STTC19
Ajay Kumar, Neha Gupta, Samarth Singh, Balark Tiwari, Madan Mohan Tripathi, Rishu Chaujar:
Carbon Nanotube Recessed Channel (CNT-RC) MOSFET for High Linearity/ULSI Applications. TENCON 2019: 2564-2567
2016
[j2]
- view
  authority control:
- export record
  dblp key:
  - journals/mj/KumarGC16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mj/KumarGC16
Ajay Kumar, Neha Gupta, Rishu Chaujar:
TCAD RF performance investigation of Transparent Gate Recessed Channel MOSFET. Microelectron. J. 49: 36-42 (2016)
[j1]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/GuptaC16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/GuptaC16
Neha Gupta, Rishu Chaujar:
Investigation of temperature variations on analog/RF and linearity performance of stacked gate GEWE-SiNW MOSFET for improved device reliability. Microelectron. Reliab. 64: 235-241 (2016)
2014
[c1]
- view
  authority control:
- export record
  dblp key:
  - conf/ised/00030C14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ised/00030C14
Neha Gupta, Ajay Kumar, Rishu Chaujar:
Impact of Channel Doping and Gate Length on Small Signal Behaviour of Gate Electrode Workfunction Engineered Silicon Nanowire MOSFET at THz Frequency. ISED 2014: 192-196

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.