BibTeX record journals/mr/GuptaC16

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@article{DBLP:journals/mr/GuptaC16,
  author    = {Neha Gupta and
               Rishu Chaujar},
  title     = {Investigation of temperature variations on analog/RF and linearity
               performance of stacked gate GEWE-SiNW {MOSFET} for improved device
               reliability},
  journal   = {Microelectron. Reliab.},
  volume    = {64},
  pages     = {235--241},
  year      = {2016},
  url       = {https://doi.org/10.1016/j.microrel.2016.07.095},
  doi       = {10.1016/j.microrel.2016.07.095},
  timestamp = {Fri, 09 Apr 2021 18:33:10 +0200},
  biburl    = {https://dblp.org/rec/journals/mr/GuptaC16.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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