default search action

combined dblp search
author search
venue search
publication search

ask others

Hiroshi Nohira

> Home > Persons

Person information

Refine list

refinements active!

zoomed in on ?? of ?? records

view refined list in

export refined list as

showing all ?? records

2010 – 2019

see FAQ

What is the meaning of the colors in the publication lists?

2016
[j4]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/ChenKWTINNK16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/ChenKWTINNK16
J. Chen, Takamasa Kawanago, Hitoshi Wakabayashi, Kazuo Tsutsui, Hiroshi Iwai, D. Nohata, Hiroshi Nohira, Kuniyuki Kakushima:
La₂O₃ gate dielectrics for AlGaN/GaN HEMT. Microelectron. Reliab. 60: 16-19 (2016)
2010
[j3]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/KakushimaOKKTKSANTSHI10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/KakushimaOKKTKSANTSHI10
Kuniyuki Kakushima, K. Okamoto, T. Koyanagi, M. Kouda, Kiichi Tachi, Takamasa Kawanago, J. Song, Parhat Ahmet, Hiroshi Nohira, Kazuo Tsutsui, Nobuyuki Sugii, Takeo Hattori, Hiroshi Iwai:
SrO capping effect for La₂O₃/Ce-silicate gate dielectrics. Microelectron. Reliab. 50(3): 356-359 (2010)

2000 – 2009

see FAQ

What is the meaning of the colors in the publication lists?

2008
[j2]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/AhmetNKNTSHI08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/AhmetNKNTSHI08
Parhat Ahmet, Kentaro Nakagawa, Kuniyuki Kakushima, Hiroshi Nohira, Kazuo Tsutsui, Nobuyuki Sugii, Takeo Hattori, Hiroshi Iwai:
Electrical characteristics of MOSFETs with La₂O₃/Y₂O₃ gate stack. Microelectron. Reliab. 48(11-12): 1769-1771 (2008)
2007
[j1]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/HattoriNSHKM07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/HattoriNSHKM07
Takeo Hattori, Hiroshi Nohira, S. Shinagawa, M. Hori, M. Kase, T. Maruizumi:
Angle-resolved photoelectron spectroscopy on gate insulators. Microelectron. Reliab. 47(1): 20-26 (2007)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.