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ORCIDMauricio de Carvalho
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2010 – 2019
- 2015
[b1]Mauricio de Carvalho:
Innovative Techniques for Testing and Diagnosing SoCs. Polytechnic University of Turin, Italy, 2015- 2014
- [j2]Mauricio de Carvalho, Paolo Bernardi
, Ernesto Sánchez, Matteo Sonza Reorda, Oscar Ballan:
Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test. J. Electron. Test. 30(3): 317-328 (2014) - 2013
- [j1]Paolo Bernardi, Mauricio de Carvalho, Ernesto Sánchez, Matteo Sonza Reorda, Alberto Bosio, Luigi Dilillo, Miroslav Valka, Patrick Girard:
Fast Power Evaluation for Effective Generation of Test Programs Maximizing Peak Power Consumption. J. Low Power Electron. 9(2): 253-263 (2013) - [c7]Mauricio de Carvalho, Paolo Bernardi, Ernesto Sánchez, Matteo Sonza Reorda, Oscar Ballan:
Increasing fault coverage during functional test in the operational phase. IOLTS 2013: 43-48 - 2012
- [c6]Paolo Bernardi, Mauricio de Carvalho, Ernesto Sánchez, Matteo Sonza Reorda, Alberto Bosio, Luigi Dilillo, Patrick Girard, Miroslav Valka:
Peak Power Estimation: A Case Study on CPU Cores. Asian Test Symposium 2012: 167-172 - [c5]Paolo Bernardi, Lyl M. Ciganda, Mauricio de Carvalho, Michelangelo Grosso, Jorge Luis Lagos-Benites, Ernesto Sánchez, Matteo Sonza Reorda, Oscar Ballan:
On-line software-based self-test of the Address Calculation Unit in RISC processors. ETS 2012: 1-6 - 2011
- [c4]Mauricio de Carvalho, Paolo Bernardi, Matteo Sonza Reorda, Nicola Campanelli, Tamas Kerekes, Davide Appello, Mario Barone, Vincenzo Tancorre, Marco Terzi:
Optimized embedded memory diagnosis. DDECS 2011: 347-352 - [c3]Miroslav Valka, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Ernesto Sánchez, Mauricio de Carvalho, Matteo Sonza Reorda:
A Functional Power Evaluation Flow for Defining Test Power Limits during At-Speed Delay Testing. ETS 2011: 153-158 - 2010
- [c2]Nicola Campanelli, Tamas Kerekes, Paolo Bernardi, Mauricio de Carvalho, Alessandro Panariti, Matteo Sonza Reorda, Davide Appello, Mario Barone:
Cumulative embedded memory failure bitmap display & analysis. DDECS 2010: 255-260 - [c1]Mauricio de Carvalho, Paolo Bernardi, Ernesto Sánchez, Matteo Sonza Reorda:
An Enhanced Strategy for Functional Stress Pattern Generation for System-on-Chip Reliability Characterization. MTV 2010: 29-34
Coauthor Index
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