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"Increasing the Fault Coverage of Processor Devices during the Operational ..."
Mauricio de Carvalho et al. (2014)
- Mauricio de Carvalho, Paolo Bernardi, Ernesto Sánchez, Matteo Sonza Reorda, Oscar Ballan:
Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test. J. Electron. Test. 30(3): 317-328 (2014)
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